Lectures: 2 sessions / week for 2 weeks, 4 hours / session
The electron microprobe provides a complete micrometer-scale quantitative chemical analysis of inorganic solids. The method is nondestructive and utilizes characteristic X-rays excited by an electron beam incident on a flat surface of the sample. This course provides an introduction to the theory of X-ray microanalysis through wavelength and energy dispersive spectrometry (WDS and EDS), ZAF matrix correction procedures and scanning electron imaging with back-scattered electron (BSE), secondary electron (SE), X-ray using WDS or EDS (elemental mapping), and cathodoluminescence (CL). Lab sessions involve hands-on use of the JEOL JXA-8200 Superprobe.
Permission of instructor.
Goldstein, J. I., D. E. Newbury, et al. Scanning Electron Microscopy and X-ray Microanalysis. 3rd ed. Kluwer Academic/Plenum Publishers, 2003. ISBN: 9780306472923. [Preview with Google Books]
The basis for the grade is completion of all the lab exercises (problem sets) and the quiz.