2.830J | Spring 2008 | Graduate

Control of Manufacturing Processes (SMA 6303)

Course Description

This course explores statistical modeling and control in manufacturing processes. Topics include the use of experimental design and response surface modeling to understand manufacturing process physics, as well as defect and parametric yield modeling and optimization. Various forms of process control, including …
This course explores statistical modeling and control in manufacturing processes. Topics include the use of experimental design and response surface modeling to understand manufacturing process physics, as well as defect and parametric yield modeling and optimization. Various forms of process control, including statistical process control, run by run and adaptive control, and real-time feedback control, are covered. Application contexts include semiconductor manufacturing, conventional metal and polymer processing, and emerging micro-nano manufacturing processes.
Learning Resource Types
Demonstration Videos
Problem Sets with Solutions
Exams with Solutions
Lecture Notes
Lecture Videos
Written Assignments with Examples
A Si stamp patterned with grids of varying orientations and linewidths is used to stamp PMMA.
To create embossed microstructures in PMMA, the silicon stamp must be carefully patterned and manufactured. (Image courtesy of Hayden Taylor. Used with permission.)