WEBVTT

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JUDY HOYT: It's very
simple, but doesn't fully

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capture all of the reality.

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The simplest analytic expression
that captures profiles

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reasonably well is the Pearson
four, which has four moments,

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and those moments are
generally tabulated in tables.

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We also presented the
idea of Monte Carlo

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or numerical solutions,
for example, Monte Carlo

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simulation, which
is quite accurate.

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And another thing called the
Boltzmann transport equation

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solution.

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The other thing we mentioned
is that there's this process

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called ion channeling.

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Ion channeling itself
is quite a challenge

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in calculating profiles.

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Calculating the profiles
pretty accurately

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into amorphous solids,
or amorphous materials,

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is reasonably routine.

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But once you have to
model ion channeling,

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it gets a little tricky.

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Today I want to cover
some things that we didn't

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get a chance to talk about.

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We never even talked
about, last time,

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the physics of the modeling of
the ion implantation process,

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that is the physical energy
loss mechanisms of the ions

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as they traverse.

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We want to talk about that.

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Once we've covered that, we
want to talk about damage.

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How do we model the
damage that takes

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place in the silicon substrate,
and how do we anneal it?

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And then I'll give a
very brief introduction

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to transient enhanced diffusion.

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The next lecture,
next Tuesday, is

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going to be dedicated
to talking about TED,

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but I'll at least briefly
introduce the topic.

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OK.

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Let's go on to slide number 2.

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The right hand
side of this slide

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is just a schematic
picture of a cartoon

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where you're shooting an
ion into a silicon surface.

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And all these
little open symbols

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here represent silicon atoms
on some kind of a lattice.

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You see an ion, which is
this dark bullet here.

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It comes in and it
hits the target.

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And when it does, it
may have some kind

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of a nuclear collision here.

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It may collide with the
target atom and be deflected.

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There'll be some
energy loss there.

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Then the target atom itself
is going to be recoiled

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and will have some
energy imparted to it.

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But that deflection is going to
then knock the ion a little bit

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into a different direction,
change its direction.

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And interestingly, you
see it going down a path.

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And right here, after
this collision right here,

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interestingly, the ion got
knocked into a channel,

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is what we're
supposed to represent.

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You see, its
direction got changed

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by this nuclear
collision and now it's

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working its way down a
little bit of a channel.

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Still losing energy, perhaps
at a slightly different rate.

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And still with each collision
creating a silicon recoil

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that's been knocked
off its lattice.

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So just a very
schematic picture.

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So again, we're
bombarding the wafer.

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The energy of this
incoming dark-colored ion

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is typically anywhere, well,
some of the lowest energy

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implants being done
today are one kilovolt,

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or maybe even slightly less.

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That's very low, but
that is being done.

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And some of the highest
energy implants for making,

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in bipolar they make selectively
implanted collector regions

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that are quite deep.

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They can work in
the 1 MeV range.

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So there's a very
wide range that people

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are eyeing at playing.

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Typically, implants are between
something like 10 to 100 keV,

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but people do use
the full range.

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Now look at the binding
energy of a silicon atom

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on the lattice.

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That's only 15 electron volts.

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So you can imagine that we're
coming in with a species that

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has thousands of times more
energy than the binding energy.

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So obviously, it's
quite possible

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to have billiard
ball-like collisions,

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where you knock these silicon
atoms off of their lattice

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sites.

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So the ions collide, and
they collide elastically.

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And they have, as a result,
we have ion deflections, which

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I just showed you here,
where the ions change

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their direction.

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And when you collide,
of course, you

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lose a certain amount of energy.

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The ion loses some
energy, and it

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displaces silicon atoms, which
we end up calling recoils.

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In addition to this collision,
this sort of pool table

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type of collision
of billiard balls,

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the ions can also suffer sort
of an inelastic drag force

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from the target electrons.

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And so this leads to
electronic stopping, where

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you lose ion energy and it
actually heats the lattice,

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to a certain extent.

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Because they're in this median
that has electrons in it.

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Eventually, this
ion and all the ions

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come to rest after they've
lost all of their energy

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in both collisional processes
and in this drag force.

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And channeling, as I mentioned,
we talked about last time.

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Along certain
directions, ions can

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travel in the crystal with very
few collisions and little drag.

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So they can go deeper
than they would otherwise,

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and that's tough to model.

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So if we go to
page 3, or slide 3,

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how do we model these
range statistics?

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Well, what we do is we
write down the total energy

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loss during an ion
trajectory, and we write it

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as a linear sum.

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So we treat these two processes
independently, nuclear losses

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and electronic losses.

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So we write the rate of energy
loss as a function of distance,

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as this equation, de by dx.

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It's a negative number,
because you're losing energy.

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N, where n is the target
atom density, atoms

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per cubic centimeter, times
the sum of these two quantities

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s sub n plus s sub e.

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Again, n is the
target atom density.

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S sub n is a function of energy.

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It's the nuclear stopping power.

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And it has units of
energy times area.

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So it's eV dash centimeter
squared is a typical unit.

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And s sub e is the
electronic stopping power,

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again eV centimeter squared.

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you can see the units work out.

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If s has units of eV
centimeter squared,

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you multiply it by atoms
per cubic centimeter,

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you get a certain amount
of eV per centimeter,

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or energy loss per unit length
in going into the crystal.

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The thing to remember
is that these functions,

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these are in general these
stopping powers are going

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to be a function of the energy.

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That is, the rate at
which you lose energy

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is a function of how
fast you're going,

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of how much energy
you actually have.

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If we know s sub n of e as a
function, and we know s sub e,

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the electronic stopping
as a function of energy,

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then you can simply compute the
range by doing this integral.

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So you integrate.

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The range would just be the
integral from 0 to e, e naught.

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Whatever your incoming energy
is, your ion-implanted energy,

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say 100 kilovolts of d e divided
by the sum of the two stopping

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powers.

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And here again, the density
is a constant number.

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It's just been pulled out.

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So you can find the
range mathematically

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if you know the physics of
these two stopping powers.

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So that's where a
lot of the modeling

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has been done in understanding
the physics of s sub n s sub e.

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And we'll first talk
about, on slide 4,

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we'll talk about
nuclear stopping.

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Above a certain energy, so
it's about half a kilovolt,

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or 500 eV.

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Now be careful, because we're
approaching this range for some

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of our very lowest
energy implants,

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making very shallow
source drain extensions.

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People are using
quite low energies.

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But if you're above this,
it's reasonably valid

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to model nuclear stopping as
a classical two-body collision

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between a silicon atom
that's sitting still

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and an incident ion that's
coming in with some velocity.

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So it can be modeled as, just
like on a pool table, two balls

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colliding, using the
conservation of energy

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and the conservation
of momentum principles

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that you learned in your
basic physics class.

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Now, why does this have to
be above a certain energy?

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Why is that the case?

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Well, it turns out, if the
energy is lower than this,

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or significantly lower,
then what happens

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is, as this incident
ion comes in,

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instead of looking like a
billiard ball, a hard sphere

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model, this ion has time to sort
of hang around the target atom,

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and the interaction is not just
like a Hartsfeld collision.

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You have other types
of interactions.

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You can have multiple interacts
with a lattice, maybe,

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in the sense of it's
going slow enough

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that as it passes
by the nucleus,

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it has different
types of interaction.

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So if your energy is low
enough, these models break down.

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But the good thing about ion
implantation, most of the time

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you're well above
that threshold.

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So, as you remember from
your basic physics class,

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we have an incident
ball coming in,

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hitting another ball that
was originally at rest.

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This incident ion is going to
be scattered at some angle.

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And you can figure that out once
the interaction potential, v

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as a function of r, r being
the distance between the two

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bodies.

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Once that's known,
then you integrate

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that along the path of the ion.

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You can calculate the scattering
angle for the collision,

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and you can do it once and
then look in a lookup table.

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So you apply basic
physics of conservation

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of energy and momentum,
you can get these numbers.

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Again, the interesting thing
about ion implantation,

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of all the processes we talk
about in this class or anyone

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does, in IC Fab, it's
the only one where,

00:09:35.550 --> 00:09:37.050 align:middle line:84%
from first principles
physics, you

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can actually predict something.

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You don't have too many
free variables the way

00:09:41.190 --> 00:09:43.350 align:middle line:84%
you do in some of these
chemical processes.

00:09:43.350 --> 00:09:46.240 align:middle line:90%


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So what it boils down to as
far as nuclear scattering goes,

00:09:49.840 --> 00:09:53.530 align:middle line:84%
is figuring out what is
the appropriate interaction

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potential, the nuclear
scattering potential?

00:09:56.380 --> 00:10:02.080 align:middle line:84%
Well, if you think about
these two bodies, an ion

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and a silicon atom with
the iron approaching it,

00:10:04.660 --> 00:10:07.330 align:middle line:84%
the first thing you
might think about

00:10:07.330 --> 00:10:09.520 align:middle line:84%
is, because you know
the nucleus is charged,

00:10:09.520 --> 00:10:11.800 align:middle line:84%
and it has a certain
charge, which

00:10:11.800 --> 00:10:16.105 align:middle line:84%
is the charge on the electron
q times it's z number.

00:10:16.105 --> 00:10:17.810 align:middle line:90%


00:10:17.810 --> 00:10:18.310 align:middle line:90%
OK.

00:10:18.310 --> 00:10:21.010 align:middle line:84%
So you might imagine
that the simplest

00:10:21.010 --> 00:10:23.170 align:middle line:84%
type of potential
interaction between these two

00:10:23.170 --> 00:10:27.370 align:middle line:84%
charged nuclei is just the
coulombic potential, which

00:10:27.370 --> 00:10:31.390 align:middle line:84%
is just given by the z
numbers multiplied together

00:10:31.390 --> 00:10:32.140 align:middle line:90%
divided by r.

00:10:32.140 --> 00:10:35.200 align:middle line:84%
So it's a 1 over r type of
good, old-fashioned Coulomb

00:10:35.200 --> 00:10:36.867 align:middle line:90%
potential.

00:10:36.867 --> 00:10:39.200 align:middle line:84%
That's a little bit too simple,
though, because the atom

00:10:39.200 --> 00:10:40.100 align:middle line:90%
is just not a nucleus.

00:10:40.100 --> 00:10:41.767 align:middle line:84%
An atom has an electron
cloud around it.

00:10:41.767 --> 00:10:45.320 align:middle line:84%
So the electrons around
the target atom nucleus

00:10:45.320 --> 00:10:47.720 align:middle line:84%
actually ends up screening
the core potential

00:10:47.720 --> 00:10:51.830 align:middle line:84%
of the nucleus, to a certain
extent, from the incoming ion.

00:10:51.830 --> 00:10:54.320 align:middle line:84%
So it's not, this is a
little bit oversimplified.

00:10:54.320 --> 00:10:57.500 align:middle line:84%
So what people do is they put
in a generalized function,

00:10:57.500 --> 00:11:01.790 align:middle line:84%
f, which they multiply
by the classical Coulomb

00:11:01.790 --> 00:11:03.350 align:middle line:84%
unscreened potential,
and then this

00:11:03.350 --> 00:11:06.650 align:middle line:84%
becomes the screened potential,
v as a function of r.

00:11:06.650 --> 00:11:10.940 align:middle line:84%
F is some generalized
function of r over a.

00:11:10.940 --> 00:11:15.640 align:middle line:84%
Again, r is the distance
between the two nuclei,

00:11:15.640 --> 00:11:19.540 align:middle line:84%
and a is a thomas-fermi
parameter, which

00:11:19.540 --> 00:11:21.310 align:middle line:90%
is related to the Bohr radius.

00:11:21.310 --> 00:11:24.190 align:middle line:84%
It's some function
of the Bohr radius

00:11:24.190 --> 00:11:26.650 align:middle line:84%
times a function
of the z numbers.

00:11:26.650 --> 00:11:28.570 align:middle line:84%
So it gives you,
a is some measure

00:11:28.570 --> 00:11:32.410 align:middle line:84%
of the, if you want to call
it the size of the atom,

00:11:32.410 --> 00:11:33.820 align:middle line:90%
in some way.

00:11:33.820 --> 00:11:35.440 align:middle line:84%
And r is, of
course, the distance

00:11:35.440 --> 00:11:40.100 align:middle line:84%
between the two, the colliding
ion and the silicon atom.

00:11:40.100 --> 00:11:42.745 align:middle line:84%
So a very common potential
that's often used

00:11:42.745 --> 00:11:43.870 align:middle line:90%
is an exponential function.

00:11:43.870 --> 00:11:49.060 align:middle line:84%
You assume that the electrons
exponentially dampen out

00:11:49.060 --> 00:11:52.180 align:middle line:84%
the Coulomb potential,
and the people

00:11:52.180 --> 00:11:54.700 align:middle line:84%
use what's called a
thomas-fermi potential.

00:11:54.700 --> 00:11:58.300 align:middle line:84%
So this function here, shown on
the third equation on slide 5

00:11:58.300 --> 00:12:01.730 align:middle line:84%
is the thomas-fermi potential
for ion implantation.

00:12:01.730 --> 00:12:05.980 align:middle line:84%
So it's got a 1 over r
dependence times an exponential

00:12:05.980 --> 00:12:08.980 align:middle line:84%
e to the minus r over
a, where again, a

00:12:08.980 --> 00:12:12.137 align:middle line:84%
is this thomas-fermi
screening parameter.

00:12:12.137 --> 00:12:12.970 align:middle line:90%
So that's potential.

00:12:12.970 --> 00:12:14.890 align:middle line:84%
That's one that was
often used in modeling

00:12:14.890 --> 00:12:16.130 align:middle line:90%
of ion implantation.

00:12:16.130 --> 00:12:20.550 align:middle line:90%


00:12:20.550 --> 00:12:26.950 align:middle line:84%
So it turns out that when the
screening function is, instead

00:12:26.950 --> 00:12:29.590 align:middle line:84%
of using exponential, if you
use a screening function f just

00:12:29.590 --> 00:12:36.670 align:middle line:84%
to be a over r, then it turns
out that if f is just a over r,

00:12:36.670 --> 00:12:39.230 align:middle line:84%
and this just the potential
just goes like 1 over r squared.

00:12:39.230 --> 00:12:42.380 align:middle line:84%
That's another way of doing
the screening function.

00:12:42.380 --> 00:12:44.830 align:middle line:84%
In that case, the
nuclear stopping power

00:12:44.830 --> 00:12:46.495 align:middle line:84%
can be approximated
by a constant.

00:12:46.495 --> 00:12:49.030 align:middle line:90%


00:12:49.030 --> 00:12:52.378 align:middle line:84%
So it turns out that
this number, and if you

00:12:52.378 --> 00:12:54.670 align:middle line:84%
want to see that derivation,
you can go to this article

00:12:54.670 --> 00:12:58.180 align:middle line:84%
by Gibbons back from the
proceedings of the IEEE,

00:12:58.180 --> 00:13:00.490 align:middle line:90%
oh, back in 1968.

00:13:00.490 --> 00:13:04.600 align:middle line:84%
And in fact, they derive that
it can be a constant number.

00:13:04.600 --> 00:13:08.800 align:middle line:84%
That depends just on
the z number of the ion,

00:13:08.800 --> 00:13:11.320 align:middle line:84%
and the mass of the
ion, and the z number

00:13:11.320 --> 00:13:13.460 align:middle line:90%
and the mass of the substrate.

00:13:13.460 --> 00:13:15.670 align:middle line:84%
So this is a simple equation
you can use if you're

00:13:15.670 --> 00:13:16.960 align:middle line:90%
stuck on a desert island.

00:13:16.960 --> 00:13:19.270 align:middle line:84%
You need to know
nuclear stopping power,

00:13:19.270 --> 00:13:21.430 align:middle line:84%
you can just program this
into your calculator.

00:13:21.430 --> 00:13:23.260 align:middle line:84%
And I just did a
simple calculation

00:13:23.260 --> 00:13:26.260 align:middle line:84%
for phosphorus, which
has a z number of 15

00:13:26.260 --> 00:13:29.560 align:middle line:84%
and an atomic mass of twice
that, or roughly a 31.

00:13:29.560 --> 00:13:33.640 align:middle line:84%
Silicon has a z number
of 14, a mass of 28 amu.

00:13:33.640 --> 00:13:36.680 align:middle line:84%
You plug these numbers in
and you do the calculation,

00:13:36.680 --> 00:13:40.750 align:middle line:84%
I get an s sub n number of
about 550 kiloelectron volts

00:13:40.750 --> 00:13:42.380 align:middle line:90%
per micron.

00:13:42.380 --> 00:13:44.270 align:middle line:84%
So that's how much
energy I lose,

00:13:44.270 --> 00:13:47.210 align:middle line:84%
if phosphorus going
in, assuming it's

00:13:47.210 --> 00:13:50.930 align:middle line:84%
a constant linear number,
550 keV per micron, just

00:13:50.930 --> 00:13:53.030 align:middle line:90%
gives you a rough idea.

00:13:53.030 --> 00:13:55.790 align:middle line:84%
And that's again, assuming a
screening function is just a 1

00:13:55.790 --> 00:13:58.490 align:middle line:84%
over r type of screening,
due to the electrons

00:13:58.490 --> 00:14:01.020 align:middle line:90%
around the nucleus.

00:14:01.020 --> 00:14:04.760 align:middle line:84%
And in fact, if you go on
to slide 7 of your handout,

00:14:04.760 --> 00:14:06.950 align:middle line:84%
I took this plot from
Mayer and Lao's book.

00:14:06.950 --> 00:14:10.530 align:middle line:84%
I referred to Mayer and
Lao earlier in the course.

00:14:10.530 --> 00:14:13.310 align:middle line:84%
In fact, handout one
has the full reference

00:14:13.310 --> 00:14:14.600 align:middle line:90%
for his textbook.

00:14:14.600 --> 00:14:18.140 align:middle line:84%
And what he's plotting
here is de by dx.

00:14:18.140 --> 00:14:20.750 align:middle line:84%
So again, that's
a keV per micron.

00:14:20.750 --> 00:14:23.360 align:middle line:90%
So it's a stopping power.

00:14:23.360 --> 00:14:26.810 align:middle line:84%
Or, if you want, you can
change both the energy unit

00:14:26.810 --> 00:14:27.860 align:middle line:90%
and the length unit.

00:14:27.860 --> 00:14:29.940 align:middle line:84%
It's equivalent to
eV per nanometer.

00:14:29.940 --> 00:14:32.150 align:middle line:84%
I prefer to think
of keV per micron,

00:14:32.150 --> 00:14:34.460 align:middle line:90%
but it's just either way.

00:14:34.460 --> 00:14:37.430 align:middle line:84%
And it's on a log log
plot, and the x-axis

00:14:37.430 --> 00:14:40.330 align:middle line:90%
is the energy of the ion.

00:14:40.330 --> 00:14:42.580 align:middle line:84%
And there are two
different types

00:14:42.580 --> 00:14:44.050 align:middle line:90%
of stopping powers shown here.

00:14:44.050 --> 00:14:45.425 align:middle line:84%
Right now, all
we've talked about

00:14:45.425 --> 00:14:47.410 align:middle line:84%
is nuclear, but let's
focus on this dashed line

00:14:47.410 --> 00:14:48.700 align:middle line:90%
here for phosphorus.

00:14:48.700 --> 00:14:53.530 align:middle line:84%
That starts up at 10 keV
and it's about 500 or so,

00:14:53.530 --> 00:14:56.230 align:middle line:84%
a little over 500
keV per micron.

00:14:56.230 --> 00:14:58.180 align:middle line:84%
And then, as you
can see, in reality,

00:14:58.180 --> 00:15:00.640 align:middle line:84%
the nuclear stopping power
given by this dashed line

00:15:00.640 --> 00:15:03.160 align:middle line:84%
is actually going down as
you go to higher energies.

00:15:03.160 --> 00:15:05.170 align:middle line:84%
But lo and behold,
the number we just

00:15:05.170 --> 00:15:07.270 align:middle line:84%
calculated in our
simple calculator,

00:15:07.270 --> 00:15:11.350 align:middle line:84%
again, assuming a thomas-fermi
screening function of 1 over r,

00:15:11.350 --> 00:15:14.260 align:middle line:84%
comes out at low energies
to give you pretty close,

00:15:14.260 --> 00:15:16.540 align:middle line:84%
asymptotically, to
what people calculate

00:15:16.540 --> 00:15:20.500 align:middle line:84%
with more sophisticated
screening functions.

00:15:20.500 --> 00:15:23.170 align:middle line:84%
Indeed, my calculation
here of 550 keV

00:15:23.170 --> 00:15:25.780 align:middle line:84%
per micron at 10 kilovolts
is pretty darn close

00:15:25.780 --> 00:15:27.797 align:middle line:84%
to that dashed line
for phosphorus.

00:15:27.797 --> 00:15:28.630 align:middle line:90%
So it's interesting.

00:15:28.630 --> 00:15:30.550 align:middle line:84%
And you can check it out
yourself for arsenic.

00:15:30.550 --> 00:15:31.960 align:middle line:84%
Again, you know the z
number and the mass,

00:15:31.960 --> 00:15:34.690 align:middle line:84%
you can check it out to see
how accurate, at low energies,

00:15:34.690 --> 00:15:37.190 align:middle line:90%
it asymptotically approaches.

00:15:37.190 --> 00:15:38.720 align:middle line:90%
So what do we notice?

00:15:38.720 --> 00:15:43.430 align:middle line:84%
Well, obvious, arsenic is a
very high z number, a high mass

00:15:43.430 --> 00:15:46.980 align:middle line:84%
element, and it's nuclear
stopping power is quite large.

00:15:46.980 --> 00:15:50.630 align:middle line:84%
It's on the order of
1,000 keV per micron,

00:15:50.630 --> 00:15:51.830 align:middle line:90%
something like that.

00:15:51.830 --> 00:15:55.250 align:middle line:84%
Phosphorus is being less,
and boron nuclear stopping

00:15:55.250 --> 00:15:56.840 align:middle line:84%
even lower, an
order of magnitude

00:15:56.840 --> 00:16:00.760 align:middle line:90%
lower than for arsenic.

00:16:00.760 --> 00:16:04.270 align:middle line:84%
The other thing on this plot,
besides these nuclear stopping

00:16:04.270 --> 00:16:07.900 align:middle line:84%
powers, the ones sub n are
nuclear, these straight lines

00:16:07.900 --> 00:16:11.020 align:middle line:84%
that increase with energy, these
are the electronic stopping

00:16:11.020 --> 00:16:12.730 align:middle line:84%
powers, and we'll
talk about that next.

00:16:12.730 --> 00:16:15.940 align:middle line:84%
This is the type of stopping
that's due to the drag

00:16:15.940 --> 00:16:19.290 align:middle line:84%
force of the electrons
in the substrate.

00:16:19.290 --> 00:16:25.360 align:middle line:84%
So let's go on to slide 8
and talk exactly about that,

00:16:25.360 --> 00:16:27.670 align:middle line:90%
this sort of non-local.

00:16:27.670 --> 00:16:28.600 align:middle line:90%
Why is it non-local?

00:16:28.600 --> 00:16:31.330 align:middle line:84%
Well, the nuclear stopping
power is local in the sense of,

00:16:31.330 --> 00:16:32.560 align:middle line:90%
you're having a collision.

00:16:32.560 --> 00:16:36.340 align:middle line:84%
The ion is coming very close
to the atom and the substrate.

00:16:36.340 --> 00:16:37.490 align:middle line:90%
You're having a deflection.

00:16:37.490 --> 00:16:41.530 align:middle line:84%
So it's an actual
physical collision,

00:16:41.530 --> 00:16:44.880 align:middle line:84%
and they interact by
this coulombic force.

00:16:44.880 --> 00:16:49.710 align:middle line:84%
This is a non-local
phenomenon called non-local

00:16:49.710 --> 00:16:51.600 align:middle line:84%
or local electronic
stopping, and there

00:16:51.600 --> 00:16:53.820 align:middle line:90%
are two ways of viewing it.

00:16:53.820 --> 00:16:57.960 align:middle line:84%
You can imagine some kind of
drag force caused by the fact

00:16:57.960 --> 00:17:00.670 align:middle line:84%
that I have a charged ion coming
in, going at some velocity.

00:17:00.670 --> 00:17:03.420 align:middle line:84%
So it's as plus, arsenic
plus, or boron plus.

00:17:03.420 --> 00:17:09.300 align:middle line:84%
Boron minus is in this sea of
electrons, the sea of electrons

00:17:09.300 --> 00:17:10.270 align:middle line:90%
where they come from.

00:17:10.270 --> 00:17:15.448 align:middle line:84%
Well, every atom in the
crystal has electrons

00:17:15.448 --> 00:17:16.240 align:middle line:90%
associated with it.

00:17:16.240 --> 00:17:18.960 align:middle line:84%
And in fact, there
are covalent bonds.

00:17:18.960 --> 00:17:22.890 align:middle line:84%
There are four covalent
bonds for every silicon atom,

00:17:22.890 --> 00:17:28.710 align:middle line:84%
with eight electrons
participating per atom.

00:17:28.710 --> 00:17:31.980 align:middle line:84%
And these covalent
electrons, essentially,

00:17:31.980 --> 00:17:37.520 align:middle line:84%
can produce a retarding effect
on the ion going through it.

00:17:37.520 --> 00:17:40.920 align:middle line:84%
So you can think of it as
sort of a retarding field.

00:17:40.920 --> 00:17:42.860 align:middle line:84%
Imagine the silicon or
the substrate that's

00:17:42.860 --> 00:17:44.930 align:middle line:90%
some kind of dielectric medium.

00:17:44.930 --> 00:17:47.420 align:middle line:84%
You have an ion coming
through it at some velocity.

00:17:47.420 --> 00:17:50.570 align:middle line:84%
This blue circle was
meant to represent, say,

00:17:50.570 --> 00:17:52.670 align:middle line:90%
the boron or the arsenic ion.

00:17:52.670 --> 00:17:56.352 align:middle line:84%
And there's this
retarding electric field.

00:17:56.352 --> 00:17:58.560 align:middle line:84%
So the interesting thing,
the thing you need to note,

00:17:58.560 --> 00:18:01.190 align:middle line:84%
the main point is, this is a
dissipative loss mechanism,

00:18:01.190 --> 00:18:03.110 align:middle line:84%
but it doesn't
change the direction.

00:18:03.110 --> 00:18:05.840 align:middle line:90%
The electrons are way too light.

00:18:05.840 --> 00:18:06.900 align:middle line:90%
They're very, very light.

00:18:06.900 --> 00:18:08.480 align:middle line:84%
They can retard or
slow down the ion,

00:18:08.480 --> 00:18:10.397 align:middle line:84%
but they're not going
to change its direction.

00:18:10.397 --> 00:18:12.660 align:middle line:84%
There's no deflection
as a result of this.

00:18:12.660 --> 00:18:15.180 align:middle line:90%
So, unlike nuclear scattering.

00:18:15.180 --> 00:18:17.250 align:middle line:84%
So that's one way of
thinking of it as a drag

00:18:17.250 --> 00:18:18.940 align:middle line:90%
force in a dielectric medium.

00:18:18.940 --> 00:18:23.040 align:middle line:84%
The other way is you can imagine
a quote unquote collision.

00:18:23.040 --> 00:18:25.820 align:middle line:84%
Now, just be careful in the
word collision, the use of it,

00:18:25.820 --> 00:18:30.320 align:middle line:84%
with electrons around the atoms
transferring some momentum

00:18:30.320 --> 00:18:38.610 align:middle line:84%
to those electrons from the
electrons from the ion itself.

00:18:38.610 --> 00:18:40.910 align:middle line:84%
So you can imagine,
here's this target atom.

00:18:40.910 --> 00:18:43.640 align:middle line:84%
It's got this electron
cloud around it.

00:18:43.640 --> 00:18:48.650 align:middle line:84%
And it transfers momentum
and actually results

00:18:48.650 --> 00:18:54.440 align:middle line:84%
in locally slowing down
this ion, basically,

00:18:54.440 --> 00:18:56.578 align:middle line:90%
reducing its velocity.

00:18:56.578 --> 00:18:58.370 align:middle line:84%
Again, there's no change
in this mechanism,

00:18:58.370 --> 00:19:02.030 align:middle line:84%
no change in the direction
of the incoming ion

00:19:02.030 --> 00:19:04.100 align:middle line:90%
when this process happens.

00:19:04.100 --> 00:19:07.010 align:middle line:84%
So both of these don't
change direction,

00:19:07.010 --> 00:19:10.640 align:middle line:84%
and both mechanisms are
related to, or involve,

00:19:10.640 --> 00:19:12.740 align:middle line:84%
the speed or the
velocity of the ion.

00:19:12.740 --> 00:19:15.910 align:middle line:90%


00:19:15.910 --> 00:19:16.420 align:middle line:90%
OK.

00:19:16.420 --> 00:19:21.640 align:middle line:84%
So if we go to the next slide
on slide 9, to first order,

00:19:21.640 --> 00:19:24.250 align:middle line:84%
people have found they can
write the electronic stopping

00:19:24.250 --> 00:19:27.230 align:middle line:84%
power as some constant
times the velocity.

00:19:27.230 --> 00:19:32.350 align:middle line:84%
So this drag mechanism,
the keV loss per micron,

00:19:32.350 --> 00:19:34.840 align:middle line:84%
due to electronic
stopping, increases

00:19:34.840 --> 00:19:40.220 align:middle line:84%
directly proportionally to
the velocity of the electron.

00:19:40.220 --> 00:19:41.345 align:middle line:90%
And what is the velocity?

00:19:41.345 --> 00:19:43.845 align:middle line:84%
Well, the velocity just goes
like the square root of energy,

00:19:43.845 --> 00:19:44.780 align:middle line:90%
right?

00:19:44.780 --> 00:19:47.000 align:middle line:84%
So you can write
electronic stopping

00:19:47.000 --> 00:19:49.430 align:middle line:84%
as some constant, k times
the square root of e.

00:19:49.430 --> 00:19:51.500 align:middle line:84%
And in fact, k has
this, very roughly,

00:19:51.500 --> 00:19:54.920 align:middle line:84%
you can approximate
k by about 2 times 10

00:19:54.920 --> 00:19:59.330 align:middle line:84%
to the minus 14th square root eV
centimeter squared, as shown up

00:19:59.330 --> 00:20:00.630 align:middle line:90%
on the top of that slide.

00:20:00.630 --> 00:20:03.650 align:middle line:84%
So this is an approximation,
but to first order,

00:20:03.650 --> 00:20:06.195 align:middle line:90%
it seems to work.

00:20:06.195 --> 00:20:08.570 align:middle line:84%
I should note here, I'm noting
in the upper right corner,

00:20:08.570 --> 00:20:10.490 align:middle line:84%
that a lot of the
improvements in ion implant

00:20:10.490 --> 00:20:13.820 align:middle line:84%
modeling over the last 5,
10 years, or however long,

00:20:13.820 --> 00:20:16.852 align:middle line:84%
have actually come from a
better, more accurate treatment

00:20:16.852 --> 00:20:17.810 align:middle line:90%
of electronic stopping.

00:20:17.810 --> 00:20:19.820 align:middle line:84%
Nuclear stopping is very
much nuclear physics,

00:20:19.820 --> 00:20:22.580 align:middle line:84%
and that's been known
for a long time now.

00:20:22.580 --> 00:20:25.280 align:middle line:84%
But this electronic drag
force is a little bit more

00:20:25.280 --> 00:20:27.508 align:middle line:84%
mysterious, a little bit
more difficult to model.

00:20:27.508 --> 00:20:29.300 align:middle line:84%
And this is where a
lot of the improvements

00:20:29.300 --> 00:20:32.390 align:middle line:90%
have come in the literature.

00:20:32.390 --> 00:20:35.360 align:middle line:84%
And particularly, this
affects light ions

00:20:35.360 --> 00:20:38.270 align:middle line:84%
like boron, for which
most of this stopping

00:20:38.270 --> 00:20:39.500 align:middle line:90%
is actually electronic.

00:20:39.500 --> 00:20:40.930 align:middle line:90%
Boron isn't very heavy.

00:20:40.930 --> 00:20:43.170 align:middle line:84%
It doesn't experience that
much nuclear stopping.

00:20:43.170 --> 00:20:46.650 align:middle line:84%
Most of what slows down a boron
ion implanted into silicon

00:20:46.650 --> 00:20:47.610 align:middle line:90%
is electronic stopping.

00:20:47.610 --> 00:20:50.760 align:middle line:84%
So boron profiles have
become more accurate,

00:20:50.760 --> 00:20:53.330 align:middle line:84%
more accurately modeled over
the last x number of years,

00:20:53.330 --> 00:20:55.080 align:middle line:84%
because people have a
little better models

00:20:55.080 --> 00:20:56.680 align:middle line:90%
for electronic stopping.

00:20:56.680 --> 00:20:59.920 align:middle line:84%
So if we look at
this plot on slide 9,

00:20:59.920 --> 00:21:02.020 align:middle line:84%
this is the total
stopping power.

00:21:02.020 --> 00:21:04.300 align:middle line:84%
It plots both the
nuclear and electronic.

00:21:04.300 --> 00:21:07.930 align:middle line:84%
So again, the units are keV per
micron in the vertical axis,

00:21:07.930 --> 00:21:09.842 align:middle line:90%
and keV on the y-axis.

00:21:09.842 --> 00:21:11.800 align:middle line:84%
And these are the same
plots I just showed you,

00:21:11.800 --> 00:21:13.008 align:middle line:90%
they're just different color.

00:21:13.008 --> 00:21:16.600 align:middle line:84%
Here's arsenic nuclear stopping,
phosphorus nuclear, boron

00:21:16.600 --> 00:21:20.520 align:middle line:84%
nuclear stopping, and here
is the electronic stopping.

00:21:20.520 --> 00:21:25.083 align:middle line:84%
And again, it's just basically
proportional to the velocity.

00:21:25.083 --> 00:21:27.750 align:middle line:84%
There's only a small dependence,
and we don't even show it here,

00:21:27.750 --> 00:21:29.110 align:middle line:90%
on the type of ion.

00:21:29.110 --> 00:21:32.850 align:middle line:84%
So we're just writing
this as this black line.

00:21:32.850 --> 00:21:36.620 align:middle line:84%
So interestingly, what you
see, an interesting energy

00:21:36.620 --> 00:21:39.770 align:middle line:84%
to point out is the energy
at which these lines cross.

00:21:39.770 --> 00:21:42.560 align:middle line:84%
And that's called the
critical energy, e sub c.

00:21:42.560 --> 00:21:46.820 align:middle line:84%
And at that point, the nuclear
electronic stopping are equal.

00:21:46.820 --> 00:21:48.610 align:middle line:84%
Beyond that, the
electronic stopping

00:21:48.610 --> 00:21:49.610 align:middle line:90%
has actually taken over.

00:21:49.610 --> 00:21:50.600 align:middle line:90%
It's much larger.

00:21:50.600 --> 00:21:52.640 align:middle line:84%
Because again, the
nuclear stopping power

00:21:52.640 --> 00:21:58.550 align:middle line:84%
is going down as you go faster,
or increases as you go slower.

00:21:58.550 --> 00:22:00.690 align:middle line:84%
But the electronic is going
the opposite direction.

00:22:00.690 --> 00:22:06.340 align:middle line:84%
So boron at 17 keV, above
that or below that energy,

00:22:06.340 --> 00:22:08.560 align:middle line:84%
basically, nuclear
stopping will be important.

00:22:08.560 --> 00:22:11.620 align:middle line:84%
Above that energy, which
is a lot of our implants,

00:22:11.620 --> 00:22:15.760 align:middle line:84%
boron is pretty much being
stopped by electronic stopping.

00:22:15.760 --> 00:22:18.040 align:middle line:90%
Phosphorus is about 150.

00:22:18.040 --> 00:22:20.860 align:middle line:84%
So any energy less
than 150, you're

00:22:20.860 --> 00:22:23.320 align:middle line:84%
going to be dominated
by nuclear stopping.

00:22:23.320 --> 00:22:26.050 align:middle line:90%
Above that will be electronic.

00:22:26.050 --> 00:22:29.860 align:middle line:84%
And arsenic is almost
always dominated,

00:22:29.860 --> 00:22:32.785 align:middle line:84%
at least in the beginning of
its path, by nuclear stopping.

00:22:32.785 --> 00:22:34.160 align:middle line:84%
The interesting
thing about this,

00:22:34.160 --> 00:22:36.220 align:middle line:84%
though, think about
an individual ion.

00:22:36.220 --> 00:22:37.680 align:middle line:84%
As an ion comes
in, of course, it

00:22:37.680 --> 00:22:40.630 align:middle line:84%
comes in with a lot of
energy, 10 keV, 100.

00:22:40.630 --> 00:22:42.640 align:middle line:84%
But by the time it
stops, it's got 0.

00:22:42.640 --> 00:22:44.530 align:middle line:90%
So every ion has to traverse.

00:22:44.530 --> 00:22:49.890 align:middle line:84%
As I first come in, let's say
I started coming in at 10 keV,

00:22:49.890 --> 00:22:53.330 align:middle line:84%
or rather, 100 keV,
and I'm right here.

00:22:53.330 --> 00:22:58.780 align:middle line:84%
So as I'm coming in here for
boron, you'd say at 100 keV,

00:22:58.780 --> 00:23:01.000 align:middle line:84%
well, electronic
stopping is dominant.

00:23:01.000 --> 00:23:01.720 align:middle line:90%
That's true.

00:23:01.720 --> 00:23:04.880 align:middle line:84%
But as the boron ion slows
down, it walks down this curve

00:23:04.880 --> 00:23:06.360 align:middle line:90%
and walks up this point.

00:23:06.360 --> 00:23:08.780 align:middle line:84%
And when it gets to very low
energy just before it stops,

00:23:08.780 --> 00:23:12.110 align:middle line:84%
in fact, nuclear stopping
always takes over.

00:23:12.110 --> 00:23:13.880 align:middle line:84%
Because at low
energies, you really

00:23:13.880 --> 00:23:16.800 align:middle line:84%
can have a lot of
billiard-ball-like collisions.

00:23:16.800 --> 00:23:19.910 align:middle line:84%
So that's why at the
end of the range,

00:23:19.910 --> 00:23:22.340 align:middle line:84%
back at the depths
of the implant that's

00:23:22.340 --> 00:23:24.830 align:middle line:84%
near the end of range, there's
a lot of nuclear stopping

00:23:24.830 --> 00:23:25.400 align:middle line:90%
that goes on.

00:23:25.400 --> 00:23:28.940 align:middle line:84%
And we'll talk about what impact
that has for damage profiles.

00:23:28.940 --> 00:23:31.720 align:middle line:90%


00:23:31.720 --> 00:23:34.057 align:middle line:84%
And here's just an
example on page 10

00:23:34.057 --> 00:23:35.140 align:middle line:90%
on different type of plot.

00:23:35.140 --> 00:23:37.090 align:middle line:90%
That was a log log plot.

00:23:37.090 --> 00:23:41.225 align:middle line:84%
I've plotted these nuclear and
electronic now on linear axes,

00:23:41.225 --> 00:23:43.600 align:middle line:84%
just so you get a feel for
what they look like on linear.

00:23:43.600 --> 00:23:45.640 align:middle line:90%
So this is de by dx.

00:23:45.640 --> 00:23:49.400 align:middle line:84%
And this is, well, it's actually
a square root of energy.

00:23:49.400 --> 00:23:52.570 align:middle line:84%
That helps linearize the,
this straight line, of course,

00:23:52.570 --> 00:23:55.360 align:middle line:84%
then, is the
electronic stopping.

00:23:55.360 --> 00:24:00.165 align:middle line:84%
And this other line here, that
it peaks at some energy, E1,

00:24:00.165 --> 00:24:01.540 align:middle line:84%
and then starts
to decrease down,

00:24:01.540 --> 00:24:02.620 align:middle line:90%
that's the nuclear stopping.

00:24:02.620 --> 00:24:04.203 align:middle line:84%
So on a linear scale,
you can actually

00:24:04.203 --> 00:24:05.840 align:middle line:90%
see what it looks like.

00:24:05.840 --> 00:24:08.260 align:middle line:84%
And again, I took this from
Mayer and Lao's textbook.

00:24:08.260 --> 00:24:10.720 align:middle line:84%
In general, the nuclear
stopping dominates,

00:24:10.720 --> 00:24:14.350 align:middle line:84%
as we said, at low energy
towards the end of the range.

00:24:14.350 --> 00:24:18.785 align:middle line:84%
And that's the location
in the substrate where

00:24:18.785 --> 00:24:21.410 align:middle line:84%
the nuclear collisions are going
to produce most of the damage.

00:24:21.410 --> 00:24:24.300 align:middle line:84%
So we call that end
of range damage.

00:24:24.300 --> 00:24:27.210 align:middle line:84%
At very high energies up
here, where I'm up here,

00:24:27.210 --> 00:24:29.020 align:middle line:90%
particles travel very quickly.

00:24:29.020 --> 00:24:31.150 align:middle line:84%
They have less time to
interact with the nucleus.

00:24:31.150 --> 00:24:34.710 align:middle line:84%
So nuclear stopping
is not as important.

00:24:34.710 --> 00:24:37.650 align:middle line:84%
They have less interaction
time, and so they

00:24:37.650 --> 00:24:38.880 align:middle line:90%
tend to be dragged down.

00:24:38.880 --> 00:24:41.010 align:middle line:84%
Nuclear stopping is
going down with energy,

00:24:41.010 --> 00:24:44.150 align:middle line:90%
where electronic is increasing.

00:24:44.150 --> 00:24:47.460 align:middle line:84%
OK, so that gives you an idea of
some of the physics of the loss

00:24:47.460 --> 00:24:49.780 align:middle line:90%
mechanisms.

00:24:49.780 --> 00:24:51.180 align:middle line:90%
So let's go on to slide 11.

00:24:51.180 --> 00:24:54.103 align:middle line:84%
So let's say I have
these nuclear stopping

00:24:54.103 --> 00:24:56.520 align:middle line:84%
powers as a function of energy,
and I have the electronic.

00:24:56.520 --> 00:24:59.370 align:middle line:84%
How do I get from that
to a calculated profile?

00:24:59.370 --> 00:25:01.050 align:middle line:84%
Well, we know we
just simply need

00:25:01.050 --> 00:25:05.700 align:middle line:84%
to do this integral if you
want to compute the range.

00:25:05.700 --> 00:25:09.660 align:middle line:84%
Or you can, directly from
Monte Carlo simulations,

00:25:09.660 --> 00:25:11.820 align:middle line:84%
you can actually simulate
that billiard ball

00:25:11.820 --> 00:25:14.850 align:middle line:84%
and those electronic
stopping processes.

00:25:14.850 --> 00:25:18.540 align:middle line:84%
Many years ago, three folks,
Lindhard, Scharff, and Schiott,

00:25:18.540 --> 00:25:20.910 align:middle line:84%
actually took these
equations, put

00:25:20.910 --> 00:25:23.610 align:middle line:84%
in nuclear and electronic
stopping powers,

00:25:23.610 --> 00:25:29.520 align:middle line:84%
and computed the moments of
distributions, given s sub n

00:25:29.520 --> 00:25:30.900 align:middle line:90%
and s sub b.

00:25:30.900 --> 00:25:35.080 align:middle line:84%
And in fact, that so-called LSS
Theory generated these tables,

00:25:35.080 --> 00:25:38.640 align:middle line:84%
I think we showed these tables
last time for common dopants

00:25:38.640 --> 00:25:42.240 align:middle line:84%
in silicon, generated tables
of the first few moments.

00:25:42.240 --> 00:25:43.770 align:middle line:84%
Maybe the first
three moments, that

00:25:43.770 --> 00:25:47.160 align:middle line:84%
generated rp, this delta rp,
or the standard deviation

00:25:47.160 --> 00:25:49.450 align:middle line:90%
sigma, and the skewness gamma.

00:25:49.450 --> 00:25:54.460 align:middle line:84%
They are tabulated and they were
calculated originally by LSS,

00:25:54.460 --> 00:25:56.410 align:middle line:84%
or they've been fit
to experimental data.

00:25:56.410 --> 00:25:58.390 align:middle line:84%
But you can calculate
these moments

00:25:58.390 --> 00:26:01.540 align:middle line:84%
from first principles
physics estimates of s

00:26:01.540 --> 00:26:03.640 align:middle line:84%
sub n as a function
of energy and s

00:26:03.640 --> 00:26:05.230 align:middle line:90%
sub e as a function of energy.

00:26:05.230 --> 00:26:08.430 align:middle line:90%


00:26:08.430 --> 00:26:08.930 align:middle line:90%
OK.

00:26:08.930 --> 00:26:12.620 align:middle line:84%
So that's basically how
people do the calculations.

00:26:12.620 --> 00:26:15.860 align:middle line:84%
What it boils down
to, the calculations

00:26:15.860 --> 00:26:18.512 align:middle line:84%
boil down to how accurately
do I know the nuclear stopping

00:26:18.512 --> 00:26:20.720 align:middle line:84%
power as a function of energy
in electronic stopping?

00:26:20.720 --> 00:26:23.030 align:middle line:84%
If I know that, I
can use a computer,

00:26:23.030 --> 00:26:25.543 align:middle line:84%
you can regenerate the
old LSS statistics,

00:26:25.543 --> 00:26:26.960 align:middle line:84%
or you can actually
use a computer

00:26:26.960 --> 00:26:29.660 align:middle line:90%
to do Monte Carlo simulation.

00:26:29.660 --> 00:26:32.870 align:middle line:84%
Because once you know
those stopping powers.

00:26:32.870 --> 00:26:35.378 align:middle line:84%
Given that, OK, so
we can figure out

00:26:35.378 --> 00:26:36.920 align:middle line:84%
where the ions end
up in the lattice.

00:26:36.920 --> 00:26:39.500 align:middle line:84%
Now we want to know
about, what kind of damage

00:26:39.500 --> 00:26:43.130 align:middle line:84%
does this incoming ion
coming in at a certain energy

00:26:43.130 --> 00:26:43.880 align:middle line:90%
do to the lattice?

00:26:43.880 --> 00:26:48.860 align:middle line:84%
So imagine I have 30
kiloelectronvolts arsenic which

00:26:48.860 --> 00:26:50.610 align:middle line:84%
is coming into the
silicon lattice.

00:26:50.610 --> 00:26:55.010 align:middle line:84%
And if you look that up in
your table in your textbook,

00:26:55.010 --> 00:26:59.200 align:middle line:84%
you'll find it has a
range of 25 nanometers,

00:26:59.200 --> 00:27:02.830 align:middle line:90%
or about 250 angstroms.

00:27:02.830 --> 00:27:05.950 align:middle line:84%
So in 250 angstroms,
actually, you

00:27:05.950 --> 00:27:08.770 align:middle line:84%
can figure that out, that
is equivalent to roughly

00:27:08.770 --> 00:27:10.753 align:middle line:90%
100 atomic planes.

00:27:10.753 --> 00:27:14.320 align:middle line:84%
It is about 0.25 or
2 and 1/2 angstroms

00:27:14.320 --> 00:27:18.100 align:middle line:90%
per plane, interplanar spacing.

00:27:18.100 --> 00:27:20.620 align:middle line:84%
So you can imagine this
arsenic ion is coming in.

00:27:20.620 --> 00:27:23.500 align:middle line:84%
It goes through about
100 atomic planes.

00:27:23.500 --> 00:27:25.750 align:middle line:84%
And how many, so
in fact, you can

00:27:25.750 --> 00:27:28.630 align:middle line:84%
think of this 30 keV arsenic
ion is coming in like this.

00:27:28.630 --> 00:27:30.970 align:middle line:84%
This squiggly line is meant
to represent its path.

00:27:30.970 --> 00:27:32.420 align:middle line:90%
Here's where it ends up.

00:27:32.420 --> 00:27:37.420 align:middle line:84%
And you can think of a cylinder
around that, sort of a cylinder

00:27:37.420 --> 00:27:40.600 align:middle line:84%
that represents the
region, which is damaged,

00:27:40.600 --> 00:27:42.490 align:middle line:84%
because it does a lot
of nuclear stopping

00:27:42.490 --> 00:27:44.950 align:middle line:84%
and you have a lot
of recoils generated

00:27:44.950 --> 00:27:47.230 align:middle line:90%
until it comes to stop.

00:27:47.230 --> 00:27:50.590 align:middle line:84%
And in fact, there's a
simplified formula, the kp

00:27:50.590 --> 00:27:53.500 align:middle line:84%
formula, that people
use to figure out,

00:27:53.500 --> 00:27:56.360 align:middle line:84%
roughly, the number of
displaced particles.

00:27:56.360 --> 00:27:59.200 align:middle line:84%
So that'd be the number of
displaced silicon atoms created

00:27:59.200 --> 00:28:00.730 align:middle line:90%
by an incoming ion.

00:28:00.730 --> 00:28:03.430 align:middle line:84%
And basically, in
simple, you can

00:28:03.430 --> 00:28:07.360 align:middle line:84%
imagine it might be related to
the energy of that ion, which

00:28:07.360 --> 00:28:13.190 align:middle line:84%
is 300 kiloelectron volts, so
that's 30,000 electron volts,

00:28:13.190 --> 00:28:15.635 align:middle line:84%
and divided by the
displacement energy.

00:28:15.635 --> 00:28:17.760 align:middle line:84%
Well, we use a factor of
one half in front of that.

00:28:17.760 --> 00:28:20.990 align:middle line:84%
But the displacement energy,
we said, was 15 electron volts.

00:28:20.990 --> 00:28:24.380 align:middle line:84%
So, just order of
magnitude estimate,

00:28:24.380 --> 00:28:26.420 align:middle line:84%
by comparing the incoming
energy to the energy

00:28:26.420 --> 00:28:29.420 align:middle line:84%
it takes to displace an
atom from the lattice,

00:28:29.420 --> 00:28:33.380 align:middle line:84%
we're talking about maybe
1,000 recoils of silicon

00:28:33.380 --> 00:28:35.980 align:middle line:84%
are created by this
one arsenic atom.

00:28:35.980 --> 00:28:37.320 align:middle line:90%
That's quite a bit.

00:28:37.320 --> 00:28:39.640 align:middle line:84%
So you're essentially
doing little ion implants

00:28:39.640 --> 00:28:44.290 align:middle line:84%
inside the substrate
every time an arsenic

00:28:44.290 --> 00:28:46.020 align:middle line:90%
atom deflects silicon.

00:28:46.020 --> 00:28:48.670 align:middle line:84%
It creates what they
call silicon knock-ons.

00:28:48.670 --> 00:28:50.710 align:middle line:84%
The silicons are knocked
on, and they themselves

00:28:50.710 --> 00:28:52.835 align:middle line:84%
have a certain energy, and
they can do more damage.

00:28:52.835 --> 00:28:56.770 align:middle line:84%
So it creates this sort of
cylinder-like region of damage,

00:28:56.770 --> 00:29:00.070 align:middle line:90%
just due to one ion.

00:29:00.070 --> 00:29:04.900 align:middle line:84%
And in fact, that was a very
schematic cartoon that we just

00:29:04.900 --> 00:29:06.200 align:middle line:90%
drew with the computer.

00:29:06.200 --> 00:29:09.190 align:middle line:84%
This is a little more
sophisticated on slide 13.

00:29:09.190 --> 00:29:13.120 align:middle line:84%
These are actually what's called
molecular dynamics simulations,

00:29:13.120 --> 00:29:14.578 align:middle line:84%
where people build
in the computer.

00:29:14.578 --> 00:29:16.995 align:middle line:84%
And of course, this is done
at Lawrence Livermore National

00:29:16.995 --> 00:29:19.240 align:middle line:84%
Lab, would have huge
supercomputing capability.

00:29:19.240 --> 00:29:23.560 align:middle line:84%
They build up a model
of the silicon lattice,

00:29:23.560 --> 00:29:26.750 align:middle line:84%
and they actually model the
physics of an incoming atom

00:29:26.750 --> 00:29:27.250 align:middle line:90%
or ion.

00:29:27.250 --> 00:29:29.590 align:middle line:84%
Here's a 5 keV
boron ion coming in.

00:29:29.590 --> 00:29:31.240 align:middle line:84%
This ion implanted
into the substrate.

00:29:31.240 --> 00:29:34.060 align:middle line:84%
And they actually follow
a whole bunch of ions

00:29:34.060 --> 00:29:36.130 align:middle line:84%
and actually look
at what happens

00:29:36.130 --> 00:29:38.110 align:middle line:90%
to these displaced recoils.

00:29:38.110 --> 00:29:41.170 align:middle line:84%
And each little snapshot
picture here, I apologize,

00:29:41.170 --> 00:29:43.600 align:middle line:84%
it didn't come out very
well when we copied it,

00:29:43.600 --> 00:29:44.960 align:middle line:90%
is a snapshot in time.

00:29:44.960 --> 00:29:47.800 align:middle line:84%
So the first little
cube is supposed

00:29:47.800 --> 00:29:50.320 align:middle line:84%
to represent a region
of the silicon where,

00:29:50.320 --> 00:29:52.340 align:middle line:90%
after 0.1 picoseconds.

00:29:52.340 --> 00:29:54.130 align:middle line:84%
So this ion has
come in, and just

00:29:54.130 --> 00:29:56.770 align:middle line:84%
at the time of 0.1 picoseconds,
there's this little cloud here.

00:29:56.770 --> 00:29:58.020 align:middle line:90%
You can see this little cloud.

00:29:58.020 --> 00:30:00.960 align:middle line:84%
That cloud represents all
the displaced silicon atoms.

00:30:00.960 --> 00:30:03.500 align:middle line:84%
So they're actually following
all these atoms displaced

00:30:03.500 --> 00:30:05.960 align:middle line:90%
from their lattice sites.

00:30:05.960 --> 00:30:09.320 align:middle line:84%
And then at five times that
time, so at half a picosecond,

00:30:09.320 --> 00:30:11.000 align:middle line:84%
look at how that
cloud has grown.

00:30:11.000 --> 00:30:15.850 align:middle line:84%
It's gone in deeper, and it's
expanded sort of laterally.

00:30:15.850 --> 00:30:18.550 align:middle line:84%
And then, interestingly,
at 10 times that again,

00:30:18.550 --> 00:30:20.860 align:middle line:84%
roughly, at 6
picoseconds, the cloud

00:30:20.860 --> 00:30:22.090 align:middle line:90%
looks a little bit smaller.

00:30:22.090 --> 00:30:24.580 align:middle line:84%
It's reached some size,
not that much different

00:30:24.580 --> 00:30:26.470 align:middle line:90%
from its first size, but why?

00:30:26.470 --> 00:30:29.200 align:middle line:84%
Well, what's happened is
that some of these silicon

00:30:29.200 --> 00:30:33.370 align:middle line:84%
atoms that were knocked off
have found that vacant lattice

00:30:33.370 --> 00:30:33.940 align:middle line:90%
sites.

00:30:33.940 --> 00:30:36.280 align:middle line:84%
So you're creating
ions of silicon atoms

00:30:36.280 --> 00:30:39.430 align:middle line:84%
that are displaced, but they
find holes in the lattice

00:30:39.430 --> 00:30:40.630 align:middle line:90%
where they can sit.

00:30:40.630 --> 00:30:44.710 align:middle line:84%
And so this becomes sort of what
the off-site silicon atoms look

00:30:44.710 --> 00:30:46.790 align:middle line:90%
like after about 6 picoseconds.

00:30:46.790 --> 00:30:48.400 align:middle line:84%
So people actually
do try to simulate

00:30:48.400 --> 00:30:50.530 align:middle line:84%
this from first principles
physics as well.

00:30:50.530 --> 00:30:52.850 align:middle line:90%


00:30:52.850 --> 00:30:56.680 align:middle line:84%
So that's a more modern
kind of calculation.

00:30:56.680 --> 00:30:59.230 align:middle line:84%
On slide 14, I'm
showing you, maybe,

00:30:59.230 --> 00:31:00.730 align:middle line:84%
a little bit more
traditional or old

00:31:00.730 --> 00:31:04.190 align:middle line:84%
fashioned calculation, what
people used to do in the 1980s.

00:31:04.190 --> 00:31:06.880 align:middle line:84%
In fact, this was taken
from a book called

00:31:06.880 --> 00:31:09.610 align:middle line:84%
The Handbook on Semiconductors
on Ion Implantation, published

00:31:09.610 --> 00:31:10.780 align:middle line:90%
back in 1980.

00:31:10.780 --> 00:31:15.880 align:middle line:84%
But what it is, rather than
that following every atom

00:31:15.880 --> 00:31:18.100 align:middle line:84%
and figuring out
what people do, is

00:31:18.100 --> 00:31:20.470 align:middle line:84%
they found a way to
calculate the energy

00:31:20.470 --> 00:31:22.630 align:middle line:84%
deposited into
nuclear processes.

00:31:22.630 --> 00:31:26.950 align:middle line:84%
Again, know the nuclear stopping
power as a function of energy.

00:31:26.950 --> 00:31:29.310 align:middle line:84%
So as we integrate those
equations in depth,

00:31:29.310 --> 00:31:31.335 align:middle line:84%
we can figure out,
at any given depth,

00:31:31.335 --> 00:31:35.910 align:middle line:84%
we know the energy of the
ion, we can integrate that up

00:31:35.910 --> 00:31:39.210 align:middle line:84%
and figure out how much nuclear
stopping is taking place

00:31:39.210 --> 00:31:40.110 align:middle line:90%
at that depth.

00:31:40.110 --> 00:31:42.990 align:middle line:84%
And therefore, you can think
of how much of the energy

00:31:42.990 --> 00:31:48.870 align:middle line:84%
loss in keV per micron
or eV per angstrom

00:31:48.870 --> 00:31:51.090 align:middle line:90%
is there at a given depth.

00:31:51.090 --> 00:31:52.950 align:middle line:84%
And here's a picture
of that calculation

00:31:52.950 --> 00:31:55.960 align:middle line:84%
or a plot, its so-called
damage density.

00:31:55.960 --> 00:31:58.860 align:middle line:84%
So it's the amount
of energy that

00:31:58.860 --> 00:32:02.370 align:middle line:84%
is lost at a given depth
due to nuclear processes,

00:32:02.370 --> 00:32:05.700 align:middle line:84%
and it has the units
of eV per angstrom

00:32:05.700 --> 00:32:08.010 align:middle line:90%
as a function of depth.

00:32:08.010 --> 00:32:10.650 align:middle line:84%
And this is for a
particular ion implant.

00:32:10.650 --> 00:32:13.140 align:middle line:84%
This is boron 11 being
implanted into silicon

00:32:13.140 --> 00:32:14.910 align:middle line:90%
at 100 kiloelectron volts.

00:32:14.910 --> 00:32:17.010 align:middle line:84%
And you can see
the damage energy.

00:32:17.010 --> 00:32:20.190 align:middle line:84%
The damage energy density
has a certain profile.

00:32:20.190 --> 00:32:23.130 align:middle line:84%
And this solid line
represents a calculation

00:32:23.130 --> 00:32:26.430 align:middle line:84%
where it includes the silicon
recoils, that is the silicon

00:32:26.430 --> 00:32:27.690 align:middle line:90%
ions that are generated.

00:32:27.690 --> 00:32:30.630 align:middle line:84%
And the dashed line is when
we have only the primary ion.

00:32:30.630 --> 00:32:33.730 align:middle line:84%
So there's not much
difference in this case.

00:32:33.730 --> 00:32:35.640 align:middle line:84%
But here's an example
of boron silicon.

00:32:35.640 --> 00:32:38.428 align:middle line:90%
It's a relatively light ion.

00:32:38.428 --> 00:32:40.470 align:middle line:84%
And the interesting thing
that it's plotted here,

00:32:40.470 --> 00:32:42.690 align:middle line:90%
is as a function of x over rp.

00:32:42.690 --> 00:32:45.780 align:middle line:84%
So remember, rp is going
to be roughly close to

00:32:45.780 --> 00:32:47.050 align:middle line:90%
where the peak of the boron.

00:32:47.050 --> 00:32:48.900 align:middle line:84%
So the boron would
peak here at 1.

00:32:48.900 --> 00:32:50.960 align:middle line:90%


00:32:50.960 --> 00:32:52.710 align:middle line:84%
So the range of the
boron atom is actually

00:32:52.710 --> 00:32:55.763 align:middle line:84%
much greater than the range
of the average silicon recoil.

00:32:55.763 --> 00:32:57.180 align:middle line:84%
That's because the
boron is light,

00:32:57.180 --> 00:33:00.610 align:middle line:84%
so it can't push the
silicon that much deeper in.

00:33:00.610 --> 00:33:02.842 align:middle line:84%
So actually the damage
density for silicon recoils

00:33:02.842 --> 00:33:04.050 align:middle line:90%
doesn't contribute that much.

00:33:04.050 --> 00:33:06.217 align:middle line:84%
So you can see that these
two, dashed and the solid,

00:33:06.217 --> 00:33:07.530 align:middle line:90%
look pretty much the same.

00:33:07.530 --> 00:33:10.530 align:middle line:84%
But interestingly, where
does the damage peak?

00:33:10.530 --> 00:33:11.760 align:middle line:90%
Pretty close to rp.

00:33:11.760 --> 00:33:15.090 align:middle line:84%
In fact, it's just
at maybe 80% of rp.

00:33:15.090 --> 00:33:16.710 align:middle line:84%
And that's a good
rule of thumb you

00:33:16.710 --> 00:33:18.660 align:middle line:84%
can use if you want
to know, all right,

00:33:18.660 --> 00:33:21.090 align:middle line:84%
I'm going to ion implant
something into a silicon

00:33:21.090 --> 00:33:22.272 align:middle line:90%
substrate.

00:33:22.272 --> 00:33:24.480 align:middle line:84%
Maybe I don't know how to
calculate the damage energy

00:33:24.480 --> 00:33:26.105 align:middle line:84%
density but I can
know how to calculate

00:33:26.105 --> 00:33:27.420 align:middle line:90%
the profile of that ion.

00:33:27.420 --> 00:33:28.920 align:middle line:90%
Where is the maximum damage?

00:33:28.920 --> 00:33:32.610 align:middle line:84%
Well, it's close to rp, but
in fact, it's just shy of rp.

00:33:32.610 --> 00:33:34.410 align:middle line:84%
So if you want to
do a lot of damage,

00:33:34.410 --> 00:33:36.930 align:middle line:84%
or usually you don't,
or you want to minimize,

00:33:36.930 --> 00:33:39.490 align:middle line:84%
you can figure
out, just below rp

00:33:39.490 --> 00:33:41.830 align:middle line:84%
is where you're going to peak
in terms of doing the most

00:33:41.830 --> 00:33:43.000 align:middle line:90%
damage to the substrate.

00:33:43.000 --> 00:33:45.460 align:middle line:90%


00:33:45.460 --> 00:33:49.810 align:middle line:84%
Here's an example on slide
15, a different situation.

00:33:49.810 --> 00:33:51.540 align:middle line:90%
Now this is the heavy ion.

00:33:51.540 --> 00:33:53.260 align:middle line:84%
The same kind of
calculations published

00:33:53.260 --> 00:33:57.070 align:middle line:84%
in Gibson's book, Handbook on
Semiconductors Ion Implantation

00:33:57.070 --> 00:33:58.860 align:middle line:90%
Volume.

00:33:58.860 --> 00:34:01.680 align:middle line:84%
Again, damage energy
density in eV per angstrom,

00:34:01.680 --> 00:34:03.250 align:middle line:90%
again, versus x over rp.

00:34:03.250 --> 00:34:03.990 align:middle line:90%
But look at this.

00:34:03.990 --> 00:34:08.159 align:middle line:84%
This time, the solid line,
now again, includes recoils

00:34:08.159 --> 00:34:11.100 align:middle line:84%
and you get this
sort of distribution.

00:34:11.100 --> 00:34:14.370 align:middle line:84%
The dashed line is for
the damage done just

00:34:14.370 --> 00:34:16.739 align:middle line:90%
by the antimony itself.

00:34:16.739 --> 00:34:19.600 align:middle line:84%
And you get a very different
damage distribution.

00:34:19.600 --> 00:34:22.920 align:middle line:84%
So what this says is for
a heavy ion like antimony,

00:34:22.920 --> 00:34:25.949 align:middle line:84%
antimony is big enough that
it can impart a lot of energy

00:34:25.949 --> 00:34:28.830 align:middle line:84%
to silicon ions, or
the silicon recoils.

00:34:28.830 --> 00:34:32.100 align:middle line:84%
And the silicon
recoils transport

00:34:32.100 --> 00:34:34.900 align:middle line:84%
a lot of that damage energy
deeper into the substrate.

00:34:34.900 --> 00:34:37.590 align:middle line:84%
So if you don't take it
when you calculate damage,

00:34:37.590 --> 00:34:39.155 align:middle line:84%
and you have a
heavy ion coming in,

00:34:39.155 --> 00:34:41.280 align:middle line:84%
if you don't take into
account the silicon recoils,

00:34:41.280 --> 00:34:42.900 align:middle line:84%
you're going to
get pretty somewhat

00:34:42.900 --> 00:34:46.360 align:middle line:84%
inaccurate distribution of where
most of the damage is done.

00:34:46.360 --> 00:34:48.360 align:middle line:84%
So you really need
to use the solid line

00:34:48.360 --> 00:34:50.580 align:middle line:84%
and include the silicon
recoils in your damage,

00:34:50.580 --> 00:34:52.199 align:middle line:84%
because the silicon
atoms then go on

00:34:52.199 --> 00:34:55.239 align:middle line:90%
and damage further the lattice.

00:34:55.239 --> 00:34:58.900 align:middle line:84%
They impart energy to
other silicon atoms.

00:34:58.900 --> 00:35:01.053 align:middle line:84%
This is for 100
kilovolt antimony.

00:35:01.053 --> 00:35:02.470 align:middle line:84%
But again, look
where the peak is.

00:35:02.470 --> 00:35:05.620 align:middle line:84%
The peak and the damage
still occurs at about close

00:35:05.620 --> 00:35:10.730 align:middle line:84%
to 80% or so of the projected
range of the antimony ion.

00:35:10.730 --> 00:35:12.370 align:middle line:90%
So that's a handy rule of thumb.

00:35:12.370 --> 00:35:15.110 align:middle line:90%


00:35:15.110 --> 00:35:17.830 align:middle line:84%
Now, what can we do
with a damage energy

00:35:17.830 --> 00:35:23.320 align:middle line:84%
profile like this, or damage
density versus x, or x over rp?

00:35:23.320 --> 00:35:27.910 align:middle line:84%
Well, if you know how much
damage in a given angstrom, how

00:35:27.910 --> 00:35:30.550 align:middle line:84%
much energy in a
given angstrom will

00:35:30.550 --> 00:35:32.530 align:middle line:84%
tend to produce
amorphization, you

00:35:32.530 --> 00:35:35.320 align:middle line:84%
could actually use
this plot to figure out

00:35:35.320 --> 00:35:39.730 align:middle line:84%
which part of the lattice is
which depth, or amorphized.

00:35:39.730 --> 00:35:41.440 align:middle line:90%
And so here's an example.

00:35:41.440 --> 00:35:43.840 align:middle line:84%
What I'm doing here, I'm
taking this calculation, which

00:35:43.840 --> 00:35:46.060 align:middle line:84%
we showed for boron a
couple of slides ago,

00:35:46.060 --> 00:35:49.660 align:middle line:84%
and I'm assuming that there's
a threshold for amorphization.

00:35:49.660 --> 00:35:51.280 align:middle line:84%
Now this has been
both calculated

00:35:51.280 --> 00:35:53.407 align:middle line:84%
and people have
tried to measure it.

00:35:53.407 --> 00:35:55.240 align:middle line:84%
I'm assuming the threshold
for amorphization

00:35:55.240 --> 00:35:58.330 align:middle line:84%
at room temperature is 6
electron volts per angstrom.

00:35:58.330 --> 00:36:02.200 align:middle line:84%
So people have kind of looked
at this either theoretically

00:36:02.200 --> 00:36:06.370 align:middle line:84%
or by looking at
actual amorphization

00:36:06.370 --> 00:36:08.860 align:middle line:84%
zones, amorphous zones,
and said that when

00:36:08.860 --> 00:36:11.140 align:middle line:84%
you get above about 6
electron volts deposited

00:36:11.140 --> 00:36:14.260 align:middle line:84%
into nuclear processes
per angstrom of depth,

00:36:14.260 --> 00:36:16.750 align:middle line:84%
the silicon has so much
damage that it goes amorphous.

00:36:16.750 --> 00:36:18.300 align:middle line:84%
So it's lost its
crystal structure.

00:36:18.300 --> 00:36:20.410 align:middle line:84%
In fact, if I draw
a line here at 6

00:36:20.410 --> 00:36:23.260 align:middle line:84%
and I see where it
cuts this profile, that

00:36:23.260 --> 00:36:27.370 align:middle line:84%
would say that this substrate,
if you're implanting boron

00:36:27.370 --> 00:36:32.320 align:middle line:84%
at 100 kilovolts, I
don't know what the dose

00:36:32.320 --> 00:36:33.550 align:middle line:90%
was in this particular case.

00:36:33.550 --> 00:36:37.480 align:middle line:84%
But it would be amorphized
between about half of rp

00:36:37.480 --> 00:36:39.700 align:middle line:90%
and up to about rp.

00:36:39.700 --> 00:36:43.540 align:middle line:84%
So in that region
between half rp and rp,

00:36:43.540 --> 00:36:46.420 align:middle line:84%
between these two lines,
it's predicted according

00:36:46.420 --> 00:36:47.950 align:middle line:84%
to this model, and
again, it's going

00:36:47.950 --> 00:36:50.380 align:middle line:84%
to be very sensitive to your
amorphization threshold,

00:36:50.380 --> 00:36:52.420 align:middle line:84%
this region in here
will be amorphized.

00:36:52.420 --> 00:36:54.960 align:middle line:84%
Everything else will
be heavily damaged.

00:36:54.960 --> 00:36:57.560 align:middle line:84%
So you can see what
boron tends to do.

00:36:57.560 --> 00:36:59.570 align:middle line:84%
Because of its
distribution, it tends

00:36:59.570 --> 00:37:01.670 align:middle line:84%
to create a buried
amorphous layer

00:37:01.670 --> 00:37:05.015 align:middle line:84%
with heavily damaged single
crystal silicon on either side.

00:37:05.015 --> 00:37:08.180 align:middle line:90%


00:37:08.180 --> 00:37:12.650 align:middle line:84%
And I just want to say a little
more about amorphization,

00:37:12.650 --> 00:37:16.540 align:middle line:90%
shown here on slide 17.

00:37:16.540 --> 00:37:19.450 align:middle line:84%
As we've talked about before, if
you give it a high enough dose,

00:37:19.450 --> 00:37:21.627 align:middle line:84%
you have enough of the
crystal is displaced,

00:37:21.627 --> 00:37:22.960 align:middle line:90%
it becomes completely amorphous.

00:37:22.960 --> 00:37:25.480 align:middle line:84%
It loses all of its
crystal structure.

00:37:25.480 --> 00:37:27.460 align:middle line:84%
There's no more
long-range order.

00:37:27.460 --> 00:37:30.220 align:middle line:84%
At this point, we have
a random arrangement.

00:37:30.220 --> 00:37:32.947 align:middle line:84%
And the damage accumulation
is saturated and really can't

00:37:32.947 --> 00:37:34.030 align:middle line:90%
talk about damage anymore.

00:37:34.030 --> 00:37:36.490 align:middle line:84%
Once you've amorphized,
there are no lattice sites,

00:37:36.490 --> 00:37:38.980 align:middle line:84%
so you can't really knock
somebody off a lattice site

00:37:38.980 --> 00:37:40.660 align:middle line:84%
because there is
no lattice site.

00:37:40.660 --> 00:37:42.730 align:middle line:90%
It's no longer a lattice.

00:37:42.730 --> 00:37:44.080 align:middle line:90%
But it just gives you an idea.

00:37:44.080 --> 00:37:47.240 align:middle line:84%
This is taken from
your textbook.

00:37:47.240 --> 00:37:49.120 align:middle line:84%
This is a cross
sectional TEM, so this

00:37:49.120 --> 00:37:52.810 align:middle line:84%
is transmission electron
micrograph pictures

00:37:52.810 --> 00:37:56.410 align:middle line:84%
of an amorphous layer formation
with increasing implant dose

00:37:56.410 --> 00:37:57.740 align:middle line:90%
from left to right.

00:37:57.740 --> 00:37:59.390 align:middle line:90%
So this is at very high energy.

00:37:59.390 --> 00:38:02.830 align:middle line:84%
It's 300 kilovolts
silicon being implanted

00:38:02.830 --> 00:38:04.910 align:middle line:90%
into a silicon substrate.

00:38:04.910 --> 00:38:07.270 align:middle line:84%
So the interesting thing
is, the ion now is silicon.

00:38:07.270 --> 00:38:10.370 align:middle line:84%
It has the same mass
as the substrate.

00:38:10.370 --> 00:38:11.660 align:middle line:90%
It's relatively light, though.

00:38:11.660 --> 00:38:14.190 align:middle line:84%
So here at 1 e
15, what do I see?

00:38:14.190 --> 00:38:16.580 align:middle line:84%
Well, here's the surface
of the silicon substrate.

00:38:16.580 --> 00:38:18.732 align:middle line:84%
And you see there's this
band, this region, where

00:38:18.732 --> 00:38:19.940 align:middle line:90%
there appears to be darkness.

00:38:19.940 --> 00:38:21.950 align:middle line:84%
There seems to be
a lot of damage,

00:38:21.950 --> 00:38:23.660 align:middle line:90%
a lot of stuff going on here.

00:38:23.660 --> 00:38:26.720 align:middle line:84%
Dark contrast, you
can imagine, might

00:38:26.720 --> 00:38:29.480 align:middle line:84%
be associated with some
kind of dislocation loops

00:38:29.480 --> 00:38:31.520 align:middle line:84%
or some kind of damage
in the substrate.

00:38:31.520 --> 00:38:33.150 align:middle line:90%
Here's a band here.

00:38:33.150 --> 00:38:35.060 align:middle line:84%
Now at 1 and 1/2
times 10 to the 15th,

00:38:35.060 --> 00:38:38.120 align:middle line:84%
there's a band, which
really has, it's buried

00:38:38.120 --> 00:38:40.460 align:middle line:84%
and it's lost its
crystalline structure.

00:38:40.460 --> 00:38:43.460 align:middle line:84%
If we were to Zoom in here and
do a selected area diffraction

00:38:43.460 --> 00:38:45.770 align:middle line:84%
on this region, we'd
find it's not a crystal.

00:38:45.770 --> 00:38:48.350 align:middle line:84%
There will be no
diffraction Laue spots.

00:38:48.350 --> 00:38:51.560 align:middle line:84%
Whereas if you go down here,
you would see crystalline.

00:38:51.560 --> 00:38:54.410 align:middle line:84%
Here's that amorphous layer
at 2 times 10 to the 15th.

00:38:54.410 --> 00:38:56.420 align:middle line:90%
It's increased in its width.

00:38:56.420 --> 00:38:59.100 align:middle line:84%
It still hasn't reached
the surface, though.

00:38:59.100 --> 00:39:02.422 align:middle line:84%
And at 4 10 to the 15th,
it's increased in depth,

00:39:02.422 --> 00:39:04.380 align:middle line:84%
but again, it hasn't
quite reached the surface.

00:39:04.380 --> 00:39:06.780 align:middle line:90%
5 10 to the 15th, almost.

00:39:06.780 --> 00:39:11.375 align:middle line:84%
And finally, at 10 to the
16th, that's a very large dose,

00:39:11.375 --> 00:39:12.750 align:middle line:84%
you've created an
amorphous layer

00:39:12.750 --> 00:39:15.420 align:middle line:84%
all the way from the
surface down to some depth.

00:39:15.420 --> 00:39:18.660 align:middle line:84%
I don't know what this is,
half micron or whatever,

00:39:18.660 --> 00:39:24.300 align:middle line:84%
and completely amorphized
from the surface down.

00:39:24.300 --> 00:39:27.260 align:middle line:84%
And this is all at
room temperature.

00:39:27.260 --> 00:39:29.960 align:middle line:84%
It turns out, it's much easier
to form an amorphous layer

00:39:29.960 --> 00:39:32.300 align:middle line:90%
at low temperatures, 77 Kelvin.

00:39:32.300 --> 00:39:35.570 align:middle line:84%
So you will sometimes see
people specifying their implant

00:39:35.570 --> 00:39:36.300 align:middle line:90%
energy.

00:39:36.300 --> 00:39:38.120 align:middle line:84%
They want to use a
special ion planter that

00:39:38.120 --> 00:39:40.580 align:middle line:84%
does, if you're doing
some of these materials

00:39:40.580 --> 00:39:43.310 align:middle line:84%
experiments, that can hold
the wafer at 77 Kelvin.

00:39:43.310 --> 00:39:46.050 align:middle line:84%
That means the damage
is much more stable.

00:39:46.050 --> 00:39:48.590 align:middle line:84%
Remember, we were talking
about that simulation

00:39:48.590 --> 00:39:50.600 align:middle line:90%
from Lawrence Livermore Labs.

00:39:50.600 --> 00:39:53.570 align:middle line:84%
You saw that damage cloud and
then a lot of recombination

00:39:53.570 --> 00:39:54.920 align:middle line:90%
by diffusion and things.

00:39:54.920 --> 00:39:56.480 align:middle line:84%
Well, if you're at
low temperatures,

00:39:56.480 --> 00:39:58.260 align:middle line:84%
you have a lot
less recombination,

00:39:58.260 --> 00:40:01.268 align:middle line:84%
so the damage tend to be
more stable, especially

00:40:01.268 --> 00:40:02.060 align:middle line:90%
with the light ion.

00:40:02.060 --> 00:40:04.160 align:middle line:84%
So if you want to
amorphize silicon

00:40:04.160 --> 00:40:07.543 align:middle line:84%
with a light ion like boron
or silicon, you pretty much,

00:40:07.543 --> 00:40:08.960 align:middle line:84%
to do it reliably,
you pretty much

00:40:08.960 --> 00:40:11.840 align:middle line:84%
have to hold the wafer at low
temperatures like 77 Kelvin.

00:40:11.840 --> 00:40:15.080 align:middle line:84%
If you have a heavy ion
that does a lot of damage,

00:40:15.080 --> 00:40:16.850 align:middle line:84%
like arsenic or
antimony, you can easily

00:40:16.850 --> 00:40:18.980 align:middle line:84%
amorphize a layer
from the surface

00:40:18.980 --> 00:40:21.300 align:middle line:90%
down at room temperature.

00:40:21.300 --> 00:40:24.410 align:middle line:90%


00:40:24.410 --> 00:40:24.910 align:middle line:90%
OK.

00:40:24.910 --> 00:40:27.220 align:middle line:84%
So let's go on to slide,
that's a picture of damage.

00:40:27.220 --> 00:40:30.530 align:middle line:84%
Let's go on to slide 18 and
talk about damage annealing.

00:40:30.530 --> 00:40:34.210 align:middle line:84%
So we have to do annealing
after we do an ion implant,

00:40:34.210 --> 00:40:35.870 align:middle line:84%
because we've bashed
up the crystal.

00:40:35.870 --> 00:40:37.537 align:middle line:84%
So what do we want
to do when we anneal?

00:40:37.537 --> 00:40:40.390 align:middle line:84%
We want to remove the primary
damage caused by the implant.

00:40:40.390 --> 00:40:44.590 align:middle line:84%
You want to put all the dopants
onto substitutional sites, that

00:40:44.590 --> 00:40:47.710 align:middle line:84%
way they can be
donors or acceptors.

00:40:47.710 --> 00:40:51.340 align:middle line:84%
We try to make the
crystal as perfect as it

00:40:51.340 --> 00:40:52.630 align:middle line:90%
was when you first started.

00:40:52.630 --> 00:40:54.338 align:middle line:84%
You never really get
it quite as perfect.

00:40:54.338 --> 00:40:55.950 align:middle line:90%


00:40:55.950 --> 00:40:58.860 align:middle line:84%
We'd also, in doing that, we
want to restore the electron

00:40:58.860 --> 00:41:01.560 align:middle line:84%
and hole mobilities, and the
carrier lifetime, hopefully,

00:41:01.560 --> 00:41:02.550 align:middle line:90%
to what it was.

00:41:02.550 --> 00:41:05.160 align:middle line:84%
And you want to do all
these things without really

00:41:05.160 --> 00:41:07.750 align:middle line:90%
having much dopant diffusion.

00:41:07.750 --> 00:41:09.400 align:middle line:90%
So it's a tough job.

00:41:09.400 --> 00:41:11.050 align:middle line:90%
It's a tough job.

00:41:11.050 --> 00:41:15.330 align:middle line:84%
And this is a model for damage
annealing, relatively simple,

00:41:15.330 --> 00:41:19.500 align:middle line:84%
but that was published back in
1991, that is very famous now,

00:41:19.500 --> 00:41:23.460 align:middle line:84%
by Martin Giles, which is
called the plus-one model

00:41:23.460 --> 00:41:25.860 align:middle line:90%
for residual damage.

00:41:25.860 --> 00:41:27.090 align:middle line:90%
Kind of a funny name.

00:41:27.090 --> 00:41:30.930 align:middle line:84%
But what Martin did was he
said the following things.

00:41:30.930 --> 00:41:34.380 align:middle line:84%
He said that most recoiled
silicon interstitials--

00:41:34.380 --> 00:41:36.630 align:middle line:84%
so again, we're going to
call this guy who's recoiled,

00:41:36.630 --> 00:41:39.750 align:middle line:84%
who ends up in an interstitial
space, an i, or a silicon

00:41:39.750 --> 00:41:42.270 align:middle line:84%
interstitial-- most of
them will find a vacancy.

00:41:42.270 --> 00:41:45.610 align:middle line:84%
And they'll recombine
very, very rapidly,

00:41:45.610 --> 00:41:47.650 align:middle line:84%
either during the
implantation process

00:41:47.650 --> 00:41:49.570 align:middle line:84%
or in the first few
seconds of annealing,

00:41:49.570 --> 00:41:52.960 align:middle line:84%
a lot of recombination
takes place.

00:41:52.960 --> 00:41:55.050 align:middle line:84%
In fact, he calculated
the distribution

00:41:55.050 --> 00:41:58.320 align:middle line:84%
of remaining recoils
after ion implantation,

00:41:58.320 --> 00:41:59.730 align:middle line:90%
without even any annealing.

00:41:59.730 --> 00:42:01.770 align:middle line:84%
And what he found,
there's a net excess

00:42:01.770 --> 00:42:04.103 align:middle line:84%
of vacancies near the
surface and a net excess

00:42:04.103 --> 00:42:05.520 align:middle line:84%
of interstitials
towards the bulk.

00:42:05.520 --> 00:42:07.270 align:middle line:84%
But there's still a
lot of them recombine.

00:42:07.270 --> 00:42:09.330 align:middle line:84%
So this is a
calculation from Giles,

00:42:09.330 --> 00:42:13.230 align:middle line:84%
and he's got concentration of
interstitials and vacancies

00:42:13.230 --> 00:42:14.850 align:middle line:90%
as a function of depth.

00:42:14.850 --> 00:42:17.910 align:middle line:84%
This solid line,
or this line on top

00:42:17.910 --> 00:42:20.970 align:middle line:84%
here, that starts at around 10
to the 20 or mid 10 of the 20

00:42:20.970 --> 00:42:25.560 align:middle line:84%
and then goes down, these
are the total interstitials

00:42:25.560 --> 00:42:27.270 align:middle line:84%
and vacancy concentrations
he calculated.

00:42:27.270 --> 00:42:28.890 align:middle line:84%
They're almost on
top of each other.

00:42:28.890 --> 00:42:31.660 align:middle line:84%
On this log scale, you
can't tell the difference.

00:42:31.660 --> 00:42:33.930 align:middle line:84%
So you create a tremendous
number of interstitials,

00:42:33.930 --> 00:42:36.570 align:middle line:84%
tremendous number of
vacancies, but most of them

00:42:36.570 --> 00:42:38.420 align:middle line:90%
all recombined.

00:42:38.420 --> 00:42:41.270 align:middle line:84%
And in fact, what he's plotted
here is the net interstitials.

00:42:41.270 --> 00:42:44.120 align:middle line:84%
So that's the number of
interstitials minus the number

00:42:44.120 --> 00:42:45.930 align:middle line:90%
of vacancies at a given point.

00:42:45.930 --> 00:42:47.520 align:middle line:84%
So that's how many
are left over.

00:42:47.520 --> 00:42:50.310 align:middle line:84%
So the net interstitials
look like this.

00:42:50.310 --> 00:42:53.480 align:middle line:84%
In fact, if you plot
the net profiles here

00:42:53.480 --> 00:42:56.510 align:middle line:84%
in the near surface region,
you have net vacancies.

00:42:56.510 --> 00:42:58.070 align:middle line:90%
So there's extra vacancies.

00:42:58.070 --> 00:43:01.100 align:middle line:84%
Down in deep, you have
net interstitials.

00:43:01.100 --> 00:43:03.200 align:middle line:84%
But the total
numbers of these net

00:43:03.200 --> 00:43:05.115 align:middle line:84%
are much, much
less than when you

00:43:05.115 --> 00:43:06.740 align:middle line:84%
do the subtraction
of the interstitials

00:43:06.740 --> 00:43:09.645 align:middle line:84%
from the vacancies, than the
total interstitial or vacancies

00:43:09.645 --> 00:43:10.770 align:middle line:90%
that were actually created.

00:43:10.770 --> 00:43:12.611 align:middle line:90%
So that's this point.

00:43:12.611 --> 00:43:14.330 align:middle line:84%
To within three
orders of magnitude,

00:43:14.330 --> 00:43:17.560 align:middle line:84%
a lot, most of these
guys recombine.

00:43:17.560 --> 00:43:19.440 align:middle line:84%
So to first order,
what he said is

00:43:19.440 --> 00:43:22.170 align:middle line:84%
that you can imagine that
all of the original damage

00:43:22.170 --> 00:43:27.240 align:middle line:84%
recombines, and leaves behind
only one interstitial created

00:43:27.240 --> 00:43:32.820 align:middle line:84%
for every phosphorus atom, or
every ion-implanted ion that

00:43:32.820 --> 00:43:33.640 align:middle line:90%
is ion implanted.

00:43:33.640 --> 00:43:34.500 align:middle line:90%
So you can imagine.

00:43:34.500 --> 00:43:37.500 align:middle line:84%
Let's say you are implanting
a dose of phosphorus.

00:43:37.500 --> 00:43:41.490 align:middle line:84%
In this particular example, my
guess is 80 keV, 10 to 13th.

00:43:41.490 --> 00:43:44.340 align:middle line:84%
He was saying that there's
one interstitial created

00:43:44.340 --> 00:43:46.410 align:middle line:90%
for every phosphorus incoming.

00:43:46.410 --> 00:43:49.410 align:middle line:84%
So he would say there's 10 to
the 13th per square centimeter

00:43:49.410 --> 00:43:51.610 align:middle line:90%
silicon interstitials created.

00:43:51.610 --> 00:43:53.560 align:middle line:90%
So it's incredibly simple.

00:43:53.560 --> 00:43:57.003 align:middle line:84%
You just take the dose of
the atoms that are implanted,

00:43:57.003 --> 00:43:58.920 align:middle line:84%
of the ions that are
implanted, and say that's

00:43:58.920 --> 00:44:00.962 align:middle line:84%
the number of interstitials
per square centimeter

00:44:00.962 --> 00:44:01.590 align:middle line:90%
that I create.

00:44:01.590 --> 00:44:03.390 align:middle line:90%
10 to the 13th.

00:44:03.390 --> 00:44:06.570 align:middle line:84%
It's called plus-one
because, and intuitively

00:44:06.570 --> 00:44:09.420 align:middle line:84%
what he's saying is, if your
implant is totally activated,

00:44:09.420 --> 00:44:12.810 align:middle line:84%
so every implanted
phosphorus ion finds

00:44:12.810 --> 00:44:16.290 align:middle line:84%
a substitutional site, well,
where did that silicon go?

00:44:16.290 --> 00:44:17.410 align:middle line:90%
It had to knock.

00:44:17.410 --> 00:44:19.760 align:middle line:84%
That silicon is somewhere
as an interstitial.

00:44:19.760 --> 00:44:20.260 align:middle line:90%
OK?

00:44:20.260 --> 00:44:21.340 align:middle line:90%
And that's all he said.

00:44:21.340 --> 00:44:23.350 align:middle line:84%
He said, assuming your
annealing is good,

00:44:23.350 --> 00:44:25.670 align:middle line:84%
you know what you're
doing, to first order,

00:44:25.670 --> 00:44:28.080 align:middle line:84%
so this is to get an order
of magnitude estimate,

00:44:28.080 --> 00:44:29.580 align:middle line:84%
the number of
interstitials I create

00:44:29.580 --> 00:44:31.400 align:middle line:84%
is equal to the dose
of what I implanted.

00:44:31.400 --> 00:44:32.400 align:middle line:90%
So that's pretty simple.

00:44:32.400 --> 00:44:34.110 align:middle line:84%
I implant 10 to
the 15th, I have 10

00:44:34.110 --> 00:44:36.780 align:middle line:84%
to the 15th excess
interstitials now in my crystal.

00:44:36.780 --> 00:44:38.640 align:middle line:84%
And that's the so-called
plus-one model.

00:44:38.640 --> 00:44:41.508 align:middle line:90%


00:44:41.508 --> 00:44:43.050 align:middle line:84%
This just tells you
a little bit more

00:44:43.050 --> 00:44:45.780 align:middle line:84%
about how accurate that
assumption might be.

00:44:45.780 --> 00:44:48.420 align:middle line:90%
This is on slide number 19.

00:44:48.420 --> 00:44:50.960 align:middle line:90%
I took this from your textbook.

00:44:50.960 --> 00:44:54.260 align:middle line:84%
It's a little bit about
damage evolution in time.

00:44:54.260 --> 00:45:00.520 align:middle line:84%
So what it's a plot of is the
annihilated interstitials,

00:45:00.520 --> 00:45:06.170 align:middle line:84%
so the recombined ones, and
vacancies per implanted ion.

00:45:06.170 --> 00:45:08.150 align:middle line:90%
OK.

00:45:08.150 --> 00:45:12.330 align:middle line:84%
And it's kind of here
as a function of time.

00:45:12.330 --> 00:45:16.130 align:middle line:84%
So if you look at, these
are Monte Carlo simulations

00:45:16.130 --> 00:45:20.690 align:middle line:84%
basically of interstitial
and vacancy recombination.

00:45:20.690 --> 00:45:23.240 align:middle line:84%
And if you go
after a short time,

00:45:23.240 --> 00:45:27.640 align:middle line:84%
really, only excess
interstitials remain.

00:45:27.640 --> 00:45:30.280 align:middle line:84%
And these can end
up forming clusters.

00:45:30.280 --> 00:45:33.280 align:middle line:84%
But basically, this bulk
and surface recombination

00:45:33.280 --> 00:45:35.060 align:middle line:84%
take place on a very
short time scale.

00:45:35.060 --> 00:45:37.060 align:middle line:84%
So look at the
bulk recombination.

00:45:37.060 --> 00:45:41.020 align:middle line:84%
Very quickly after here,
after only, I don't know,

00:45:41.020 --> 00:45:44.110 align:middle line:84%
10 to the minus 6 seconds
was at a microsecond.

00:45:44.110 --> 00:45:45.670 align:middle line:84%
There's a lot of
bulk recombination

00:45:45.670 --> 00:45:47.140 align:middle line:90%
that's taken place.

00:45:47.140 --> 00:45:49.750 align:middle line:84%
Surface recombination,
for vacancies,

00:45:49.750 --> 00:45:51.010 align:middle line:90%
takes a shorter time.

00:45:51.010 --> 00:45:54.760 align:middle line:84%
And then finally surface
interstitial recombination

00:45:54.760 --> 00:45:58.900 align:middle line:84%
can take place within
100 to 1 second.

00:45:58.900 --> 00:46:02.710 align:middle line:84%
So you have a lot of
interstitial and vacancy

00:46:02.710 --> 00:46:06.280 align:middle line:84%
recombination, that was the
point of what Giles was saying,

00:46:06.280 --> 00:46:10.950 align:middle line:84%
so that only plus 1 interstitial
excess interstitial remains.

00:46:10.950 --> 00:46:13.110 align:middle line:84%
Now, what happens to
those 10 to the 15th?

00:46:13.110 --> 00:46:16.350 align:middle line:84%
If I ion implant 10 to
the 15th phosphorus atoms,

00:46:16.350 --> 00:46:19.050 align:middle line:84%
I have 10 to the 15th
excess interstitials.

00:46:19.050 --> 00:46:20.700 align:middle line:84%
The name of the game
is, what happens

00:46:20.700 --> 00:46:21.825 align:middle line:90%
to all these interstitials?

00:46:21.825 --> 00:46:23.400 align:middle line:84%
Well, it turns
out they coalesce.

00:46:23.400 --> 00:46:26.080 align:middle line:84%
They get together
into little defects.

00:46:26.080 --> 00:46:28.620 align:middle line:84%
And these little defects are
called, in curly brackets,

00:46:28.620 --> 00:46:30.160 align:middle line:90%
called 311 defects.

00:46:30.160 --> 00:46:33.270 align:middle line:84%
And we'll talk in detail
next time about 311s.

00:46:33.270 --> 00:46:35.790 align:middle line:84%
But the interesting thing
about these little clusters,

00:46:35.790 --> 00:46:38.610 align:middle line:84%
these 311s, they
are defects end up

00:46:38.610 --> 00:46:41.080 align:middle line:84%
being stable for
very long periods.

00:46:41.080 --> 00:46:42.600 align:middle line:84%
So the interstitials
come, we have

00:46:42.600 --> 00:46:44.730 align:middle line:84%
all these excess
interstitials, they end up

00:46:44.730 --> 00:46:47.160 align:middle line:84%
getting together and forming
little defects, which

00:46:47.160 --> 00:46:50.520 align:middle line:84%
then can stay around for 10
seconds, 100 seconds, maybe

00:46:50.520 --> 00:46:53.160 align:middle line:84%
even minutes and hours,
depending on the temperature.

00:46:53.160 --> 00:46:56.130 align:middle line:84%
And it's these little defects
these 311s, that end up

00:46:56.130 --> 00:46:58.770 align:middle line:84%
being responsible for the
process of transenhanced fusion

00:46:58.770 --> 00:47:01.125 align:middle line:84%
that we're going to model
in the next lecture.

00:47:01.125 --> 00:47:03.820 align:middle line:90%


00:47:03.820 --> 00:47:08.500 align:middle line:84%
In fact, on slide 20, just
by way of introduction.

00:47:08.500 --> 00:47:12.910 align:middle line:84%
These are pictures
of [? 311 ?] defects.

00:47:12.910 --> 00:47:16.210 align:middle line:84%
The right hand side is
an actual high resolution

00:47:16.210 --> 00:47:18.550 align:middle line:84%
cross-section transmission
electron micrograph.

00:47:18.550 --> 00:47:20.050 align:middle line:84%
And I can tell it's
high resolution,

00:47:20.050 --> 00:47:24.315 align:middle line:84%
because you can see these little
dots, and they form in planes.

00:47:24.315 --> 00:47:25.690 align:middle line:84%
Well, these little
dots, each dot

00:47:25.690 --> 00:47:28.060 align:middle line:90%
represents two silicon atoms.

00:47:28.060 --> 00:47:30.310 align:middle line:84%
And they're all
lined up in planes,

00:47:30.310 --> 00:47:35.330 align:middle line:84%
because you're looking at the
crystal planes in the silicon

00:47:35.330 --> 00:47:35.830 align:middle line:90%
lattice.

00:47:35.830 --> 00:47:38.372 align:middle line:84%
And you see this little funny
looking thing right here that's

00:47:38.372 --> 00:47:39.400 align:middle line:90%
tilted at an angle.

00:47:39.400 --> 00:47:42.490 align:middle line:84%
It goes from this point here,
this dark band of contrast,

00:47:42.490 --> 00:47:43.570 align:middle line:90%
to this point here.

00:47:43.570 --> 00:47:47.050 align:middle line:84%
That is a ribbon-like
region that is identified.

00:47:47.050 --> 00:47:49.560 align:middle line:90%
That is the [? 311 ?] defect.

00:47:49.560 --> 00:47:51.770 align:middle line:84%
And that's an actual
cross section TEM

00:47:51.770 --> 00:47:52.835 align:middle line:90%
micrograph on the left.

00:47:52.835 --> 00:47:56.870 align:middle line:84%
It is meant to represent
a color cartoon of what

00:47:56.870 --> 00:47:58.400 align:middle line:90%
this thing actually looks like.

00:47:58.400 --> 00:48:03.450 align:middle line:84%
The axis here, along the defect,
is represented by this vector

00:48:03.450 --> 00:48:06.878 align:middle line:84%
here, that turns out
to be, this vector

00:48:06.878 --> 00:48:08.670 align:middle line:84%
turns out to be in the
[? 311 ?] direction.

00:48:08.670 --> 00:48:10.295 align:middle line:84%
That's how these
things got their name.

00:48:10.295 --> 00:48:13.050 align:middle line:84%
They were tilted in the
[? 311 ?] direction.

00:48:13.050 --> 00:48:16.290 align:middle line:84%
The long axis of the ribbon,
this is a ribbon-like defect,

00:48:16.290 --> 00:48:19.920 align:middle line:84%
the long axis points along 1
0 direction in the crystal.

00:48:19.920 --> 00:48:22.470 align:middle line:84%
So the long axis here,
you can't really see.

00:48:22.470 --> 00:48:27.450 align:middle line:84%
It'll be into the board
or into the slide.

00:48:27.450 --> 00:48:31.080 align:middle line:84%
These little round things
here, these circles,

00:48:31.080 --> 00:48:33.660 align:middle line:84%
represent interstitials,
and they're little dimers.

00:48:33.660 --> 00:48:36.810 align:middle line:84%
They come in pairs, and they
line up along this direction.

00:48:36.810 --> 00:48:39.840 align:middle line:90%
Could be 100 angstroms long.

00:48:39.840 --> 00:48:44.090 align:middle line:84%
And it's got some sort of width
to it, which you can see here.

00:48:44.090 --> 00:48:45.840 align:middle line:84%
And it has a certain
capture radius.

00:48:45.840 --> 00:48:48.697 align:middle line:84%
Within a certain region, it
will capture these interstitials

00:48:48.697 --> 00:48:49.905 align:middle line:90%
and form this little cluster.

00:48:49.905 --> 00:48:52.380 align:middle line:90%


00:48:52.380 --> 00:48:55.860 align:middle line:84%
These [? 311 ?] defects,
they flow in pretty quickly,

00:48:55.860 --> 00:48:58.950 align:middle line:90%
in a matter of a second or less.

00:48:58.950 --> 00:49:02.190 align:middle line:84%
But they anneal out in
timescale of minutes,

00:49:02.190 --> 00:49:03.910 align:middle line:90%
at moderate temperatures.

00:49:03.910 --> 00:49:06.690 align:middle line:84%
And as they anneal out,
as this ribbon heals,

00:49:06.690 --> 00:49:08.940 align:middle line:84%
it spits out silicon
interstitials.

00:49:08.940 --> 00:49:11.070 align:middle line:84%
And it's these
silicon interstitials

00:49:11.070 --> 00:49:13.995 align:middle line:84%
that are coming out of
this [? 311 ?] ribbon

00:49:13.995 --> 00:49:15.870 align:middle line:84%
that lead to the transient
enhanced diffusion

00:49:15.870 --> 00:49:19.640 align:middle line:84%
effect, these excess
silicon interstitials.

00:49:19.640 --> 00:49:22.040 align:middle line:84%
It turns out that
below a certain dose,

00:49:22.040 --> 00:49:25.490 align:middle line:84%
or below a certain damage
value, these [? 311 ?] defects

00:49:25.490 --> 00:49:27.468 align:middle line:90%
can dissolve completely.

00:49:27.468 --> 00:49:28.510 align:middle line:90%
So you can dissolve them.

00:49:28.510 --> 00:49:29.968 align:middle line:84%
You can completely
get rid of them.

00:49:29.968 --> 00:49:32.200 align:middle line:84%
And at that point, when
they're completely gone,

00:49:32.200 --> 00:49:34.420 align:middle line:84%
you have no more TED
after that amount of time.

00:49:34.420 --> 00:49:36.850 align:middle line:90%
You go back to normal diffusion.

00:49:36.850 --> 00:49:39.460 align:middle line:84%
Above a certain damage
level, actually, it's

00:49:39.460 --> 00:49:41.500 align:middle line:90%
a little more complicated.

00:49:41.500 --> 00:49:45.160 align:middle line:84%
They actually get together, they
turn into stable dislocation

00:49:45.160 --> 00:49:47.230 align:middle line:84%
loops, which are more
difficult or sometimes

00:49:47.230 --> 00:49:48.250 align:middle line:90%
impossible to remove.

00:49:48.250 --> 00:49:50.237 align:middle line:90%
That's like end of range damage.

00:49:50.237 --> 00:49:52.570 align:middle line:84%
But there's a certain region
in which you can remove all

00:49:52.570 --> 00:49:54.880 align:middle line:84%
the [? 311 ?]s,s, certain
amount of damage.

00:49:54.880 --> 00:49:57.750 align:middle line:90%


00:49:57.750 --> 00:49:58.250 align:middle line:90%
OK.

00:49:58.250 --> 00:50:00.290 align:middle line:84%
So when we're going to
talk about [? 311 ?]ss

00:50:00.290 --> 00:50:03.450 align:middle line:84%
and their annealing kinetics
in great detail next lecture,

00:50:03.450 --> 00:50:07.160 align:middle line:84%
when we go through the whole
kinetics of transient enhanced

00:50:07.160 --> 00:50:08.145 align:middle line:90%
diffusion.

00:50:08.145 --> 00:50:10.020 align:middle line:84%
In the meantime, I want
to go on and continue

00:50:10.020 --> 00:50:11.790 align:middle line:84%
to talk about other
aspects of annealing.

00:50:11.790 --> 00:50:13.680 align:middle line:84%
So we know we create
all these interstitials.

00:50:13.680 --> 00:50:16.260 align:middle line:90%
They get together in [? 311 ?]s.

00:50:16.260 --> 00:50:18.432 align:middle line:84%
We know if we go to
high enough dose,

00:50:18.432 --> 00:50:20.640 align:middle line:84%
remember I showed you a
picture that we can amorphize

00:50:20.640 --> 00:50:23.880 align:middle line:84%
the crystal, well, let's say
I do create an amorphous layer

00:50:23.880 --> 00:50:24.870 align:middle line:90%
at the surface.

00:50:24.870 --> 00:50:26.940 align:middle line:84%
How can I get rid of
that amorphous layer

00:50:26.940 --> 00:50:29.400 align:middle line:84%
and restore the crystal to
perfect, or to some kind

00:50:29.400 --> 00:50:30.270 align:middle line:90%
of crystallinity?

00:50:30.270 --> 00:50:31.830 align:middle line:84%
Well, this is
exactly what happens.

00:50:31.830 --> 00:50:35.100 align:middle line:84%
I'm showing here
cross-section TEM images.

00:50:35.100 --> 00:50:37.920 align:middle line:84%
This layer is originally
amorphous from the surface

00:50:37.920 --> 00:50:41.900 align:middle line:84%
of the wafer down to some
depth, and we're regrowing it.

00:50:41.900 --> 00:50:45.200 align:middle line:84%
So we're annealing
the wafer at 525.

00:50:45.200 --> 00:50:47.100 align:middle line:84%
The initial implant
was quite high.

00:50:47.100 --> 00:50:50.360 align:middle line:84%
It's 200 kilovolts, 6 times
10 to the 15th of antimony.

00:50:50.360 --> 00:50:52.620 align:middle line:84%
Again, antimony is
a very heavy atom,

00:50:52.620 --> 00:50:56.060 align:middle line:84%
so it amorphized from
the surface down.

00:50:56.060 --> 00:50:58.550 align:middle line:84%
And we're looking here,
initially, at 0 minutes.

00:50:58.550 --> 00:51:01.250 align:middle line:84%
So guess that kind of
got cut off of the slide,

00:51:01.250 --> 00:51:03.830 align:middle line:84%
but this should be
here at 0 minutes,

00:51:03.830 --> 00:51:05.450 align:middle line:90%
so just when you first start.

00:51:05.450 --> 00:51:07.820 align:middle line:84%
After 10 minutes of
annealing at 525,

00:51:07.820 --> 00:51:11.210 align:middle line:84%
look at the interface between
the amorphous and the crystal

00:51:11.210 --> 00:51:13.600 align:middle line:90%
substrate has moved up.

00:51:13.600 --> 00:51:17.620 align:middle line:84%
So the amorphous layer is
actually grown, or regrown,

00:51:17.620 --> 00:51:19.700 align:middle line:84%
by a process called
solid phase epitaxy.

00:51:19.700 --> 00:51:23.740 align:middle line:84%
So there's no melting going on,
but in a layer-by-layer method,

00:51:23.740 --> 00:51:27.070 align:middle line:84%
the atoms in each layer
are taking the template

00:51:27.070 --> 00:51:29.530 align:middle line:84%
from the substrate and
rearranging themselves back

00:51:29.530 --> 00:51:30.940 align:middle line:90%
into a single crystal form.

00:51:30.940 --> 00:51:34.510 align:middle line:84%
And this amorphous
layer is progressing up

00:51:34.510 --> 00:51:36.310 align:middle line:84%
from the depths
towards the surface,

00:51:36.310 --> 00:51:40.180 align:middle line:84%
you can see it as time goes
on, in kind of a linear fashion

00:51:40.180 --> 00:51:42.600 align:middle line:90%
in an epitaxial growth.

00:51:42.600 --> 00:51:45.140 align:middle line:84%
So we call it solid phase EPI
as opposed to vapor phase.

00:51:45.140 --> 00:51:48.350 align:middle line:84%
Vapor phase would be if I were
injecting xylene or something

00:51:48.350 --> 00:51:51.930 align:middle line:84%
and growing EPI Here I just
have a solid solution that's

00:51:51.930 --> 00:51:54.200 align:middle line:90%
regrowing at 525.

00:51:54.200 --> 00:51:56.568 align:middle line:84%
When you're done-- or,
well, this isn't quite done.

00:51:56.568 --> 00:51:57.860 align:middle line:90%
At 20 minutes it's almost done.

00:51:57.860 --> 00:52:02.030 align:middle line:84%
Maybe half an hour-- you would
see the entire amorphous region

00:52:02.030 --> 00:52:03.140 align:middle line:90%
will have been regrown.

00:52:03.140 --> 00:52:04.520 align:middle line:90%
It'll all be single crystal.

00:52:04.520 --> 00:52:06.350 align:middle line:84%
And you'll be left
with something though.

00:52:06.350 --> 00:52:09.630 align:middle line:84%
There's a band of
residual damage

00:52:09.630 --> 00:52:13.650 align:middle line:84%
that occurs called end
of range damage, or EOR.

00:52:13.650 --> 00:52:15.420 align:middle line:84%
And these are
defects that are just

00:52:15.420 --> 00:52:17.520 align:middle line:84%
below the amorphous
crystalline interface.

00:52:17.520 --> 00:52:19.080 align:middle line:84%
So you get an idea
of where they are.

00:52:19.080 --> 00:52:20.850 align:middle line:90%
They're always just below that.

00:52:20.850 --> 00:52:22.740 align:middle line:84%
And those are pretty
hard to get out.

00:52:22.740 --> 00:52:24.683 align:middle line:84%
Those generally
don't ever go away.

00:52:24.683 --> 00:52:26.100 align:middle line:84%
You have a certain
amount of that,

00:52:26.100 --> 00:52:29.690 align:middle line:84%
for such a high dose, that
you have to live with.

00:52:29.690 --> 00:52:31.490 align:middle line:84%
You have to find a
way to deal with it.

00:52:31.490 --> 00:52:33.830 align:middle line:90%


00:52:33.830 --> 00:52:36.290 align:middle line:84%
This slide on page
22 actually shows

00:52:36.290 --> 00:52:40.430 align:middle line:84%
you some data from a book
by Gibbons and Sigman,

00:52:40.430 --> 00:52:42.810 align:middle line:84%
called Laser Annealing
of Semiconductors.

00:52:42.810 --> 00:52:44.900 align:middle line:90%
So it's about laser annealing.

00:52:44.900 --> 00:52:45.590 align:middle line:90%
The book is.

00:52:45.590 --> 00:52:48.650 align:middle line:84%
But this particular chapter
is about solid-phase EPI

00:52:48.650 --> 00:52:52.130 align:middle line:84%
or solid-phase regrowth,
just in a furnace.

00:52:52.130 --> 00:52:55.050 align:middle line:84%
And what they're plotting
here is the regrowth rate.

00:52:55.050 --> 00:52:57.590 align:middle line:84%
So this gives you the number
of angstroms per minute

00:52:57.590 --> 00:53:00.733 align:middle line:84%
as that amorphous layer
traverses from down below up.

00:53:00.733 --> 00:53:02.150 align:middle line:84%
The number of
angstroms per minute

00:53:02.150 --> 00:53:05.330 align:middle line:84%
that it goes, as a function
of inverse temperature

00:53:05.330 --> 00:53:08.190 align:middle line:84%
for silicon and under
different conditions.

00:53:08.190 --> 00:53:09.830 align:middle line:90%
So let's take a curve here.

00:53:09.830 --> 00:53:11.960 align:middle line:84%
Let's take this one
curve right here

00:53:11.960 --> 00:53:15.810 align:middle line:84%
that is called 100
silicon undoped

00:53:15.810 --> 00:53:17.340 align:middle line:90%
as a function of temperature.

00:53:17.340 --> 00:53:21.390 align:middle line:84%
And you can see, for
undoped silicon, say at 525,

00:53:21.390 --> 00:53:25.630 align:middle line:84%
the regrowth rate is about 20
or 30 angstroms per minute.

00:53:25.630 --> 00:53:27.990 align:middle line:84%
So as a constant rate, these
people have measured this,

00:53:27.990 --> 00:53:30.600 align:middle line:84%
there's a technique called
Rutherford backscattering, ion

00:53:30.600 --> 00:53:33.720 align:middle line:84%
channeling, you can actually
measure this rate going up.

00:53:33.720 --> 00:53:37.110 align:middle line:84%
And you can see
how fast it goes.

00:53:37.110 --> 00:53:39.360 align:middle line:84%
Gives you an idea of how
that amorphous layer regrows.

00:53:39.360 --> 00:53:41.280 align:middle line:90%
And that's at 525.

00:53:41.280 --> 00:53:43.080 align:middle line:84%
So you can see,
amorphous layer regrowth

00:53:43.080 --> 00:53:44.940 align:middle line:84%
can happen at reasonably
low temperatures.

00:53:44.940 --> 00:53:46.425 align:middle line:90%
You don't have to go too hot.

00:53:46.425 --> 00:53:49.050 align:middle line:84%
Interestingly, though, there are
lots of different curves here.

00:53:49.050 --> 00:53:51.300 align:middle line:84%
If you go to the 110
silicon, so if you

00:53:51.300 --> 00:53:55.320 align:middle line:84%
buy a wafer that is
110 surface instead,

00:53:55.320 --> 00:53:58.380 align:middle line:84%
you've got a different atomic
density on that 110 plane,

00:53:58.380 --> 00:53:59.760 align:middle line:90%
and in fact, it regrows slower.

00:53:59.760 --> 00:54:05.540 align:middle line:84%
The same activation energy,
ea of 2.3 electron volts.

00:54:05.540 --> 00:54:08.370 align:middle line:84%
Interestingly, that number
is kind of intriguing.

00:54:08.370 --> 00:54:10.970 align:middle line:84%
That's also what people
believe 2.2 is roughly

00:54:10.970 --> 00:54:13.100 align:middle line:90%
the bond breaking energy.

00:54:13.100 --> 00:54:16.280 align:middle line:84%
And so imagine that interface
between the amorphous

00:54:16.280 --> 00:54:17.780 align:middle line:84%
and the single
crystal, you probably

00:54:17.780 --> 00:54:20.330 align:middle line:84%
have to break some
bonds there, initially

00:54:20.330 --> 00:54:23.280 align:middle line:90%
in order to realign the atoms.

00:54:23.280 --> 00:54:25.010 align:middle line:90%
So SPE is pretty fast.

00:54:25.010 --> 00:54:26.960 align:middle line:84%
It depends on
orientation, and it

00:54:26.960 --> 00:54:28.590 align:middle line:84%
depends, what's
really interesting,

00:54:28.590 --> 00:54:32.030 align:middle line:84%
it depends very
much so on doping.

00:54:32.030 --> 00:54:35.690 align:middle line:84%
So for example, here's silicon
that's doped with arsenic.

00:54:35.690 --> 00:54:40.100 align:middle line:84%
You can be quite a bit
faster, 3 to 5 times faster,

00:54:40.100 --> 00:54:42.320 align:middle line:90%
or phosphorous, or boron.

00:54:42.320 --> 00:54:44.870 align:middle line:84%
Boron is the fastest,
it looks like.

00:54:44.870 --> 00:54:48.500 align:middle line:84%
If you accidentally put oxygen
or nitrogen into your sample,

00:54:48.500 --> 00:54:50.310 align:middle line:84%
look what happens to
the regrowth rate.

00:54:50.310 --> 00:54:52.410 align:middle line:84%
You can go down by almost
an order of magnitude.

00:54:52.410 --> 00:54:55.590 align:middle line:90%
So impurities have a big effect.

00:54:55.590 --> 00:54:59.700 align:middle line:84%
And argon would
even really do it,

00:54:59.700 --> 00:55:01.500 align:middle line:90%
really frustrates the regrowth.

00:55:01.500 --> 00:55:03.150 align:middle line:84%
And so it's important
to know what's

00:55:03.150 --> 00:55:05.670 align:middle line:84%
in your crystal, what
your ion implanting will

00:55:05.670 --> 00:55:07.620 align:middle line:84%
have a big effect on
the regrowth rate.

00:55:07.620 --> 00:55:10.920 align:middle line:84%
Interestingly, when you do
this, most of the dopant atoms,

00:55:10.920 --> 00:55:13.110 align:middle line:84%
like arsenic,
phosphorus, boron, are

00:55:13.110 --> 00:55:15.210 align:middle line:84%
incorporated as that
amorphous layer moves up.

00:55:15.210 --> 00:55:16.710 align:middle line:84%
They're actually
mostly incorporated

00:55:16.710 --> 00:55:19.120 align:middle line:84%
on substitutional sites,
even at low temperatures.

00:55:19.120 --> 00:55:23.520 align:middle line:84%
So it turns out, if you can
create an amorphous layer,

00:55:23.520 --> 00:55:28.560 align:middle line:84%
this is one of the best
ways of activating a dopant,

00:55:28.560 --> 00:55:30.540 align:middle line:84%
is to create an amorphous
layer in silicon.

00:55:30.540 --> 00:55:32.040 align:middle line:84%
Now this is the way
silicon anneals.

00:55:32.040 --> 00:55:34.270 align:middle line:84%
Other semiconductors,
gallium arsenide for example,

00:55:34.270 --> 00:55:35.160 align:middle line:90%
is just the opposite.

00:55:35.160 --> 00:55:37.620 align:middle line:84%
If you amorphize
it, God help you

00:55:37.620 --> 00:55:41.652 align:middle line:84%
trying to get the
dopants to get activated.

00:55:41.652 --> 00:55:42.360 align:middle line:90%
It's not so easy.

00:55:42.360 --> 00:55:44.130 align:middle line:84%
But silicon has this
beautiful property

00:55:44.130 --> 00:55:46.980 align:middle line:84%
that as that layer moves up,
a lot of the dopant atoms

00:55:46.980 --> 00:55:48.690 align:middle line:84%
get forced onto
substitutional sites.

00:55:48.690 --> 00:55:50.160 align:middle line:84%
And then the donors
and acceptors

00:55:50.160 --> 00:55:53.460 align:middle line:84%
are already activated at low
temperature, to a great degree.

00:55:53.460 --> 00:55:55.870 align:middle line:90%
So that's a nice property.

00:55:55.870 --> 00:55:57.625 align:middle line:84%
Assuming you fully
amorphize the crystal.

00:55:57.625 --> 00:56:00.100 align:middle line:90%


00:56:00.100 --> 00:56:01.660 align:middle line:90%
OK, let's go on to slide 23.

00:56:01.660 --> 00:56:04.870 align:middle line:84%
I mentioned that
life is not perfect.

00:56:04.870 --> 00:56:07.920 align:middle line:84%
Even if you
amorphize, you always

00:56:07.920 --> 00:56:10.380 align:middle line:84%
end up with this
end of range damage.

00:56:10.380 --> 00:56:14.230 align:middle line:84%
And here's a plot
on the left of,

00:56:14.230 --> 00:56:16.230 align:middle line:84%
let's say this is the
surface of a silicon wafer

00:56:16.230 --> 00:56:17.850 align:middle line:90%
here, going down in depth.

00:56:17.850 --> 00:56:19.560 align:middle line:90%
And here's my concentration.

00:56:19.560 --> 00:56:22.140 align:middle line:84%
And let's say I have implanted
something, maybe it's arsenic,

00:56:22.140 --> 00:56:22.890 align:middle line:90%
I don't know what.

00:56:22.890 --> 00:56:24.450 align:middle line:84%
And it has this ion
implanted profile.

00:56:24.450 --> 00:56:25.242 align:middle line:90%
It looks like this.

00:56:25.242 --> 00:56:27.720 align:middle line:90%


00:56:27.720 --> 00:56:34.290 align:middle line:84%
And there is, the maximum damage
for this particular profile

00:56:34.290 --> 00:56:37.420 align:middle line:84%
is just below the
amorphization threshold.

00:56:37.420 --> 00:56:42.062 align:middle line:84%
So this region from here to
here, from the surface down to,

00:56:42.062 --> 00:56:44.520 align:middle line:84%
this dashed line is called the
amorphous crystal interface,

00:56:44.520 --> 00:56:45.690 align:middle line:90%
that's all amorphized.

00:56:45.690 --> 00:56:48.235 align:middle line:84%
So that's going to
regrow layer by layer

00:56:48.235 --> 00:56:50.610 align:middle line:84%
and give you very good crystal
quality, if I just go back

00:56:50.610 --> 00:56:51.870 align:middle line:90%
a couple of slides here.

00:56:51.870 --> 00:56:56.340 align:middle line:84%
Again, it was amorphized
to this depth.

00:56:56.340 --> 00:56:59.040 align:middle line:84%
If you look at this
depth when you're done,

00:56:59.040 --> 00:57:00.780 align:middle line:90%
there is no residual damage.

00:57:00.780 --> 00:57:02.850 align:middle line:84%
It's below the initial
amorphous crystal

00:57:02.850 --> 00:57:04.920 align:middle line:84%
interface by some
distance, that you end up

00:57:04.920 --> 00:57:07.050 align:middle line:90%
with it's end of range.

00:57:07.050 --> 00:57:09.900 align:middle line:84%
And it kind of makes sense,
because at this point,

00:57:09.900 --> 00:57:12.630 align:middle line:84%
you have deposited-- averted
this depth enough energy

00:57:12.630 --> 00:57:14.070 align:middle line:90%
to amorphize the crystal.

00:57:14.070 --> 00:57:16.680 align:middle line:84%
Below that, you've deposited
a huge amount of energy,

00:57:16.680 --> 00:57:17.940 align:middle line:90%
but not enough to amorphize.

00:57:17.940 --> 00:57:20.190 align:middle line:84%
So you've really bashed it
up, but it's not amorphous,

00:57:20.190 --> 00:57:22.830 align:middle line:84%
so it can't regrow by
solid phase EPI Instead,

00:57:22.830 --> 00:57:24.900 align:middle line:84%
it creates dislocation
loops, and that's

00:57:24.900 --> 00:57:26.330 align:middle line:90%
what we call the end of range.

00:57:26.330 --> 00:57:30.350 align:middle line:84%
So if I go back to
the slide number 23,

00:57:30.350 --> 00:57:33.690 align:middle line:84%
just below the amorphous region
of this end of range damage.

00:57:33.690 --> 00:57:36.050 align:middle line:84%
And here is my ion
implanted arsenic.

00:57:36.050 --> 00:57:36.560 align:middle line:90%
OK.

00:57:36.560 --> 00:57:37.060 align:middle line:90%
So.

00:57:37.060 --> 00:57:37.940 align:middle line:90%
Now, let's see.

00:57:37.940 --> 00:57:41.420 align:middle line:84%
I'm using this to
make an np junction.

00:57:41.420 --> 00:57:45.220 align:middle line:84%
So what I need to do, if I'm
going to make an np junction,

00:57:45.220 --> 00:57:46.690 align:middle line:84%
what I typically
want to do is just

00:57:46.690 --> 00:57:49.420 align:middle line:84%
to diffuse the n type
dopant a little bit deeper

00:57:49.420 --> 00:57:51.890 align:middle line:90%
than the end of range damage.

00:57:51.890 --> 00:57:55.660 align:middle line:84%
So we tend to try to get
a little bit of diffusion

00:57:55.660 --> 00:57:57.010 align:middle line:90%
after we've done an ion implant.

00:57:57.010 --> 00:58:00.020 align:middle line:84%
Sometimes, that can be helpful,
because why would that matter?

00:58:00.020 --> 00:58:03.160 align:middle line:84%
Well, here's my end of,
I've done an overlay.

00:58:03.160 --> 00:58:05.560 align:middle line:84%
This is a cross-section
TEM micrograph.

00:58:05.560 --> 00:58:07.360 align:middle line:84%
And here's my end
of range damage,

00:58:07.360 --> 00:58:09.370 align:middle line:84%
this little black
dislocation bar.

00:58:09.370 --> 00:58:13.280 align:middle line:84%
And imagine I diffuse this
arsenic just a little deeper.

00:58:13.280 --> 00:58:15.640 align:middle line:84%
So now I have an n plus
region that goes just

00:58:15.640 --> 00:58:19.720 align:middle line:84%
below the end of range damage,
and then below that I have p.

00:58:19.720 --> 00:58:22.860 align:middle line:90%
Well, this is n plus, this is p.

00:58:22.860 --> 00:58:25.980 align:middle line:84%
The depletion region, again,
always tends to extend,

00:58:25.980 --> 00:58:28.770 align:middle line:84%
if you remember your np
or pn junction physics,

00:58:28.770 --> 00:58:31.800 align:middle line:84%
the depleted region is going to
be in the lightly doped side,

00:58:31.800 --> 00:58:33.330 align:middle line:90%
where the yellow is.

00:58:33.330 --> 00:58:35.460 align:middle line:84%
So the yellow is depleted
of free carriers.

00:58:35.460 --> 00:58:37.590 align:middle line:84%
And you know, in the
depletion region,

00:58:37.590 --> 00:58:40.530 align:middle line:84%
that's where you get the
most amount of recombination

00:58:40.530 --> 00:58:44.500 align:middle line:84%
of electrons and holes to
create leakage in a pn junction.

00:58:44.500 --> 00:58:46.950 align:middle line:84%
So the depletion region
is the last place

00:58:46.950 --> 00:58:50.010 align:middle line:84%
you want damage or defects,
because in the depletion

00:58:50.010 --> 00:58:51.630 align:middle line:84%
region, electron
hole recombination

00:58:51.630 --> 00:58:53.200 align:middle line:90%
is very efficient.

00:58:53.200 --> 00:58:56.260 align:middle line:84%
So what we do, what people
do, this is kind of cheating,

00:58:56.260 --> 00:58:59.520 align:middle line:84%
but they cover up the
end of range damage

00:58:59.520 --> 00:59:01.870 align:middle line:90%
with a heavily doped region.

00:59:01.870 --> 00:59:04.590 align:middle line:84%
So if you see people making
source drain junctions,

00:59:04.590 --> 00:59:08.310 align:middle line:84%
they often diffuse it just a
little ways beyond the EOR,

00:59:08.310 --> 00:59:10.800 align:middle line:84%
and then they get diodes
that are pretty good.

00:59:10.800 --> 00:59:11.730 align:middle line:90%
Reasonably good.

00:59:11.730 --> 00:59:13.400 align:middle line:84%
If they don't diffuse
it at all, they

00:59:13.400 --> 00:59:16.890 align:middle line:84%
say I'm going to have a perfect
anneal, no diffusion, in fact,

00:59:16.890 --> 00:59:19.830 align:middle line:84%
then the n plus junction
might have been back here,

00:59:19.830 --> 00:59:22.090 align:middle line:84%
and then the EOR might have
been in the yellow region,

00:59:22.090 --> 00:59:24.257 align:middle line:84%
in the depletion region,
at the end of range damage,

00:59:24.257 --> 00:59:26.800 align:middle line:84%
and you could get a
lot leakier diode.

00:59:26.800 --> 00:59:29.520 align:middle line:84%
So there's a lot of
optimization when

00:59:29.520 --> 00:59:32.070 align:middle line:84%
people activate source
drains, or something

00:59:32.070 --> 00:59:33.690 align:middle line:90%
where they care about leakage.

00:59:33.690 --> 00:59:36.720 align:middle line:84%
There's a lot of optimization
in just exactly how much

00:59:36.720 --> 00:59:39.360 align:middle line:84%
damage dopant
diffusion do I allow,

00:59:39.360 --> 00:59:46.210 align:middle line:84%
and how much time do I allow to
try to get rid of these loops?

00:59:46.210 --> 00:59:48.210 align:middle line:84%
So it's kind of an
interesting, damage annealing

00:59:48.210 --> 00:59:52.230 align:middle line:84%
is an interesting combination
between knowledge of p n

00:59:52.230 --> 00:59:55.860 align:middle line:84%
junction physics, and electronic
recombination mechanisms,

00:59:55.860 --> 00:59:57.570 align:middle line:84%
and knowledge of the
crystal structure

00:59:57.570 --> 00:59:58.920 align:middle line:84%
and what kind of
damage you've created.

00:59:58.920 --> 01:00:01.045 align:middle line:84%
And you need to optimize
that, because you'll never

01:00:01.045 --> 01:00:03.090 align:middle line:84%
get rid of all damage,
to a certain extent,

01:00:03.090 --> 01:00:04.252 align:middle line:90%
for every single implant.

01:00:04.252 --> 01:00:06.210 align:middle line:84%
Some implants are easier
to anneal than others.

01:00:06.210 --> 01:00:08.900 align:middle line:90%


01:00:08.900 --> 01:00:09.400 align:middle line:90%
OK.

01:00:09.400 --> 01:00:12.075 align:middle line:84%
So that was in terms of, I
spoke there quite a while

01:00:12.075 --> 01:00:14.200 align:middle line:84%
about trying to get rid of
damage, because I wanted

01:00:14.200 --> 01:00:15.560 align:middle line:90%
to get good pn junctions.

01:00:15.560 --> 01:00:16.690 align:middle line:90%
I want to get low leakage.

01:00:16.690 --> 01:00:17.190 align:middle line:90%
OK.

01:00:17.190 --> 01:00:21.250 align:middle line:84%
That's only one requirement,
is low leakage in the crystal.

01:00:21.250 --> 01:00:23.110 align:middle line:84%
I also want to
activate the dopant.

01:00:23.110 --> 01:00:25.870 align:middle line:84%
You want to ion implant
10 to the 15th arsenic

01:00:25.870 --> 01:00:27.460 align:middle line:84%
atoms per square
centimeter, you'd

01:00:27.460 --> 01:00:29.260 align:middle line:84%
like to get 10 to
the 15th electrons

01:00:29.260 --> 01:00:30.310 align:middle line:90%
per square centimeter.

01:00:30.310 --> 01:00:32.018 align:middle line:84%
You'd like to have
all of that activated.

01:00:32.018 --> 01:00:32.650 align:middle line:90%
Or boron.

01:00:32.650 --> 01:00:34.060 align:middle line:84%
That's the whole reason
you're putting it in.

01:00:34.060 --> 01:00:35.860 align:middle line:84%
You don't care about
boron in the lattice.

01:00:35.860 --> 01:00:38.830 align:middle line:84%
It's the holes that it
produces, or the electrons

01:00:38.830 --> 01:00:40.780 align:middle line:90%
that arsenic produces.

01:00:40.780 --> 01:00:44.690 align:middle line:84%
Well, it turns out, if you
amorphize the substrate,

01:00:44.690 --> 01:00:46.240 align:middle line:84%
again this only
applies to silicon,

01:00:46.240 --> 01:00:47.823 align:middle line:84%
gallium arsenide is
just the opposite.

01:00:47.823 --> 01:00:51.070 align:middle line:84%
But if you amorphize the
silicon that we mentioned,

01:00:51.070 --> 01:00:53.645 align:middle line:84%
that a solid phase epi is
an ideal way of repairing

01:00:53.645 --> 01:00:55.270 align:middle line:84%
the damage and also
getting the dopants

01:00:55.270 --> 01:00:57.930 align:middle line:90%
onto substitutional sites.

01:00:57.930 --> 01:01:01.410 align:middle line:84%
If you don't amorphize, so
you do a lower dose that

01:01:01.410 --> 01:01:04.350 align:middle line:84%
does a lot of damage but doesn't
create an amorphous layer,

01:01:04.350 --> 01:01:06.780 align:middle line:84%
so you can't have
SPE, it turns out

01:01:06.780 --> 01:01:08.790 align:middle line:84%
that activation is
a lot more complex,

01:01:08.790 --> 01:01:12.180 align:middle line:84%
because you create defects that
are somewhat stable over time

01:01:12.180 --> 01:01:13.300 align:middle line:90%
and temperature.

01:01:13.300 --> 01:01:16.290 align:middle line:84%
So here's just an example,
of a plot of the annealing

01:01:16.290 --> 01:01:17.940 align:middle line:84%
characteristics of
arsenic and silicon

01:01:17.940 --> 01:01:20.380 align:middle line:90%
I took out of your textbook.

01:01:20.380 --> 01:01:23.350 align:middle line:84%
And the y-axis here is
the fraction active.

01:01:23.350 --> 01:01:24.820 align:middle line:90%
So I want to be up to one.

01:01:24.820 --> 01:01:27.520 align:middle line:84%
If I'm at one, that means
every single arsenic atom

01:01:27.520 --> 01:01:29.740 align:middle line:84%
that I implanted
contributes electron

01:01:29.740 --> 01:01:31.240 align:middle line:84%
and they're all
electrically active.

01:01:31.240 --> 01:01:35.240 align:middle line:84%
And this is as a function
of annealing temperature.

01:01:35.240 --> 01:01:37.070 align:middle line:84%
And there are different
doses shown here.

01:01:37.070 --> 01:01:40.102 align:middle line:84%
So the red curve assumes
I've amorphized the silicon.

01:01:40.102 --> 01:01:40.810 align:middle line:90%
And look at this.

01:01:40.810 --> 01:01:41.518 align:middle line:90%
Very interesting.

01:01:41.518 --> 01:01:45.640 align:middle line:84%
At 550, 525, I can
activate for 1e-15 implant,

01:01:45.640 --> 01:01:47.950 align:middle line:90%
I can activate almost 80%.

01:01:47.950 --> 01:01:49.130 align:middle line:90%
That's pretty good.

01:01:49.130 --> 01:01:51.065 align:middle line:84%
And if I increase the
temperature up to 800,

01:01:51.065 --> 01:01:52.690 align:middle line:84%
it doesn't actually
activate much more.

01:01:52.690 --> 01:01:55.540 align:middle line:84%
So if I want to do a really low
temperature anneal in silicon,

01:01:55.540 --> 01:01:58.060 align:middle line:84%
I can do that with
a 1e-15 implant.

01:01:58.060 --> 01:02:01.000 align:middle line:84%
Except for 20% of my
atoms, I get them active.

01:02:01.000 --> 01:02:05.140 align:middle line:84%
But let's say I only
implanted 1e-14 instead.

01:02:05.140 --> 01:02:08.080 align:middle line:84%
At that same temperature,
only 10% are active.

01:02:08.080 --> 01:02:09.190 align:middle line:90%
Very few.

01:02:09.190 --> 01:02:12.160 align:middle line:84%
So if I have an
intermediate dose

01:02:12.160 --> 01:02:14.410 align:middle line:84%
1e-14 might be
more typical dose,

01:02:14.410 --> 01:02:16.390 align:middle line:84%
say, for the source
strain extensions,

01:02:16.390 --> 01:02:21.320 align:middle line:84%
might be 1e-14 That's a
miserable dose, because it's

01:02:21.320 --> 01:02:23.447 align:middle line:84%
pretty high to do some
damage, but it's low enough

01:02:23.447 --> 01:02:24.530 align:middle line:90%
that it doesn't amorphize.

01:02:24.530 --> 01:02:26.900 align:middle line:84%
And so to activate
the extensions here,

01:02:26.900 --> 01:02:29.000 align:middle line:84%
this 1e-14 dose, you
really need to get up

01:02:29.000 --> 01:02:33.650 align:middle line:84%
to 750, 800 or whatever
to get 80% activation.

01:02:33.650 --> 01:02:35.860 align:middle line:90%


01:02:35.860 --> 01:02:38.200 align:middle line:84%
So we don't just think,
oh for any implant

01:02:38.200 --> 01:02:40.310 align:middle line:84%
I want I just do
a certain anneal

01:02:40.310 --> 01:02:41.560 align:middle line:90%
and I'll get the same results.

01:02:41.560 --> 01:02:44.890 align:middle line:84%
It really depends on the
amount of damage I did,

01:02:44.890 --> 01:02:47.980 align:middle line:84%
and whether I was below or above
the amorphization threshold.

01:02:47.980 --> 01:02:51.280 align:middle line:84%
Here, if you go to really low
doses, it's a piece of cake.

01:02:51.280 --> 01:02:54.070 align:middle line:84%
Again, here at 10 to
the 12th it's not bad.

01:02:54.070 --> 01:02:57.460 align:middle line:84%
Because you did so little
damage even at 600, 700,

01:02:57.460 --> 01:03:00.380 align:middle line:84%
you can get pretty close
to 80% to 100% activation.

01:03:00.380 --> 01:03:03.130 align:middle line:84%
So the tough spot is this
intermediate dose regime

01:03:03.130 --> 01:03:05.170 align:middle line:84%
which is exactly the
dose regime where

01:03:05.170 --> 01:03:07.550 align:middle line:84%
we're ion implanting source
drain tips or source drain

01:03:07.550 --> 01:03:08.050 align:middle line:90%
extensions.

01:03:08.050 --> 01:03:10.240 align:middle line:84%
And those need to be
active as full as possible.

01:03:10.240 --> 01:03:13.660 align:middle line:84%
So unfortunately, it
does make our life

01:03:13.660 --> 01:03:16.980 align:middle line:90%
a little more challenging.

01:03:16.980 --> 01:03:18.660 align:middle line:90%
That was arsenic.

01:03:18.660 --> 01:03:20.100 align:middle line:90%
That actually isn't that bad.

01:03:20.100 --> 01:03:23.040 align:middle line:90%
Even more complicated is boron.

01:03:23.040 --> 01:03:27.210 align:middle line:84%
And again, I took this
plot from your textbook.

01:03:27.210 --> 01:03:29.880 align:middle line:84%
It's the same kind of plot,
now I'm on a semi-log plot,

01:03:29.880 --> 01:03:33.720 align:middle line:84%
so I've got a log scale on
the y-axis and temperature

01:03:33.720 --> 01:03:35.700 align:middle line:90%
of annealing on the x-axis.

01:03:35.700 --> 01:03:38.040 align:middle line:90%
And different doses again.

01:03:38.040 --> 01:03:40.950 align:middle line:84%
So for boron, if you
have a low dose up here,

01:03:40.950 --> 01:03:44.280 align:middle line:84%
8 times 10 to the 12th,
again at 550, 600,

01:03:44.280 --> 01:03:48.870 align:middle line:84%
I can get, oh, maybe 70,
or 50% to 60% active.

01:03:48.870 --> 01:03:52.500 align:middle line:84%
Not that great,
but not terrible.

01:03:52.500 --> 01:03:54.780 align:middle line:84%
Interestingly, at the
very high dose regime,

01:03:54.780 --> 01:03:58.080 align:middle line:84%
2 times 10 to the 15th, if I
kneel at very low temperatures,

01:03:58.080 --> 01:04:00.900 align:middle line:84%
say 500, I get a
reasonable active,

01:04:00.900 --> 01:04:01.900 align:middle line:90%
well it's not very good.

01:04:01.900 --> 01:04:03.210 align:middle line:90%
It's only 1 in 10.

01:04:03.210 --> 01:04:05.433 align:middle line:90%
But it actually goes down.

01:04:05.433 --> 01:04:07.350 align:middle line:84%
It actually goes down
in a certain temperature

01:04:07.350 --> 01:04:09.318 align:middle line:90%
range between 550 and 700.

01:04:09.318 --> 01:04:10.860 align:middle line:84%
So you're actually
reverse annealing.

01:04:10.860 --> 01:04:12.660 align:middle line:84%
You're taking the
dopant atoms off site.

01:04:12.660 --> 01:04:14.160 align:middle line:84%
And then finally,
it takes up again.

01:04:14.160 --> 01:04:16.660 align:middle line:84%
When it takes off
again, when you get up

01:04:16.660 --> 01:04:19.150 align:middle line:90%
above about 750 or 800.

01:04:19.150 --> 01:04:21.490 align:middle line:84%
So to get full
activation of boron,

01:04:21.490 --> 01:04:23.633 align:middle line:84%
you really need
to be in silicon.

01:04:23.633 --> 01:04:26.050 align:middle line:84%
At almost any dose, you need
to be in the high temperature

01:04:26.050 --> 01:04:28.030 align:middle line:90%
regime, 900 or above.

01:04:28.030 --> 01:04:29.510 align:middle line:90%
And that's a real problem.

01:04:29.510 --> 01:04:31.930 align:middle line:84%
That's why you will hear
people say, oh boron

01:04:31.930 --> 01:04:33.370 align:middle line:90%
is hard to activate.

01:04:33.370 --> 01:04:35.560 align:middle line:84%
In general, it requires
higher temperatures

01:04:35.560 --> 01:04:37.180 align:middle line:84%
or some kind of
more sophisticated

01:04:37.180 --> 01:04:38.650 align:middle line:84%
annealing technique
than arsenic.

01:04:38.650 --> 01:04:40.810 align:middle line:84%
And that's because of the
type of damage it does.

01:04:40.810 --> 01:04:43.870 align:middle line:84%
It does not tend to
amorphize, unless you

01:04:43.870 --> 01:04:44.902 align:middle line:90%
go to really high doses.

01:04:44.902 --> 01:04:46.360 align:middle line:84%
It's very hard to
get an amorphous.

01:04:46.360 --> 01:04:49.780 align:middle line:84%
And so you cannot take advantage
as easily of the solid phase

01:04:49.780 --> 01:04:50.425 align:middle line:90%
epi regrowth.

01:04:50.425 --> 01:04:52.760 align:middle line:90%


01:04:52.760 --> 01:04:54.290 align:middle line:90%
Now, one thing you can do.

01:04:54.290 --> 01:04:55.970 align:middle line:84%
You say, OK, boron
doesn't amorphize.

01:04:55.970 --> 01:04:56.690 align:middle line:90%
What could I do?

01:04:56.690 --> 01:04:58.970 align:middle line:84%
People do something
called pre-amorphization.

01:04:58.970 --> 01:05:01.700 align:middle line:84%
So before they implant
a boron profile,

01:05:01.700 --> 01:05:03.980 align:middle line:84%
they might implant a
high dose of silicon,

01:05:03.980 --> 01:05:06.140 align:middle line:84%
amorphize the crystal
to a certain depth,

01:05:06.140 --> 01:05:08.480 align:middle line:84%
then put the boron
in by implant,

01:05:08.480 --> 01:05:10.520 align:middle line:84%
and then regrow the
whole thing by SPE.

01:05:10.520 --> 01:05:12.890 align:middle line:84%
And you can cheat that
way, in some sense,

01:05:12.890 --> 01:05:14.827 align:middle line:84%
or it's an extra
step, but then you

01:05:14.827 --> 01:05:16.910 align:middle line:84%
can get a little better
annealing characteristics.

01:05:16.910 --> 01:05:19.310 align:middle line:84%
But this is assuming you didn't
do any pre-amorphization.

01:05:19.310 --> 01:05:21.470 align:middle line:84%
This is just, implant
the boron at this dose,

01:05:21.470 --> 01:05:23.900 align:middle line:90%
and try to anneal it.

01:05:23.900 --> 01:05:29.600 align:middle line:84%
So what is this reverse
annealing behavior?

01:05:29.600 --> 01:05:32.720 align:middle line:84%
Well, it's probably,
oh, there's a typo here.

01:05:32.720 --> 01:05:33.620 align:middle line:90%
It's thought.

01:05:33.620 --> 01:05:34.580 align:middle line:90%
There's a T missing.

01:05:34.580 --> 01:05:35.600 align:middle line:90%
It's thought to occur.

01:05:35.600 --> 01:05:37.340 align:middle line:84%
Because there's some
kind of competition

01:05:37.340 --> 01:05:39.680 align:middle line:84%
here between the native
interstitial point

01:05:39.680 --> 01:05:44.210 align:middle line:84%
defects, the things that
you're creating-- remember,

01:05:44.210 --> 01:05:45.710 align:middle line:84%
you create more
point defects as you

01:05:45.710 --> 01:05:48.453 align:middle line:84%
raise the temperature-- and
the boron atoms themselves

01:05:48.453 --> 01:05:49.370 align:middle line:90%
for the lattice sites.

01:05:49.370 --> 01:05:51.770 align:middle line:84%
Because again, we did not
amorphize the crystal.

01:05:51.770 --> 01:05:54.180 align:middle line:90%
We just created a lot of damage.

01:05:54.180 --> 01:05:55.940 align:middle line:84%
So there's a sort of
range where you just

01:05:55.940 --> 01:05:57.350 align:middle line:90%
don't want to be annealing.

01:05:57.350 --> 01:06:00.620 align:middle line:84%
Here at this dose of 2
times 10 to the 14th,

01:06:00.620 --> 01:06:02.995 align:middle line:84%
you want to take
the boron up higher.

01:06:02.995 --> 01:06:05.370 align:middle line:84%
The problem with going to
higher temperatures, of course,

01:06:05.370 --> 01:06:06.453 align:middle line:90%
is you get more diffusion.

01:06:06.453 --> 01:06:10.540 align:middle line:90%


01:06:10.540 --> 01:06:13.320 align:middle line:84%
So let me go on to slide 26
and just say a few words.

01:06:13.320 --> 01:06:16.072 align:middle line:84%
We're going to spend the
entire next lecture on this,

01:06:16.072 --> 01:06:18.030 align:middle line:84%
on something called
transit enhanced diffusion,

01:06:18.030 --> 01:06:20.860 align:middle line:84%
and this is sort of
exemplified here.

01:06:20.860 --> 01:06:26.067 align:middle line:84%
Here is an implant that
was done, say, of it

01:06:26.067 --> 01:06:27.150 align:middle line:90%
could be boron or arsenic.

01:06:27.150 --> 01:06:28.775 align:middle line:84%
It doesn't really
matter at this point.

01:06:28.775 --> 01:06:29.850 align:middle line:90%
But let's say it's boron.

01:06:29.850 --> 01:06:31.680 align:middle line:84%
And we see two
different anneals.

01:06:31.680 --> 01:06:37.080 align:middle line:84%
The blue curve I did 1,000
degrees C for 10 seconds,

01:06:37.080 --> 01:06:42.930 align:middle line:84%
and I got that diffusion profile
after I implanted the boron.

01:06:42.930 --> 01:06:48.120 align:middle line:84%
And now the red curve
is 2 minutes at 800.

01:06:48.120 --> 01:06:51.000 align:middle line:84%
And so, interestingly,
you would think, well,

01:06:51.000 --> 01:06:52.680 align:middle line:90%
I'm annealing it at 800.

01:06:52.680 --> 01:06:54.270 align:middle line:90%
That's a much lower temperature.

01:06:54.270 --> 01:06:56.010 align:middle line:84%
The boron diffusion
coefficient is

01:06:56.010 --> 01:06:57.990 align:middle line:84%
down by two orders
of magnitude at 800.

01:06:57.990 --> 01:07:01.770 align:middle line:84%
So even though I'm annealing
it for a slightly longer time,

01:07:01.770 --> 01:07:05.520 align:middle line:84%
it's certainly not 100 times
longer or 200 times longer.

01:07:05.520 --> 01:07:08.310 align:middle line:84%
So you would think that the
800 degrees C profile should

01:07:08.310 --> 01:07:09.840 align:middle line:90%
be shallower than the 1,000.

01:07:09.840 --> 01:07:13.170 align:middle line:84%
So TED, unfortunately,
is this strange effect,

01:07:13.170 --> 01:07:15.120 align:middle line:84%
and we'll talk about
how this can happen,

01:07:15.120 --> 01:07:16.860 align:middle line:84%
is that even at
lower temperatures

01:07:16.860 --> 01:07:18.630 align:middle line:84%
you can even get deeper
junctions than you

01:07:18.630 --> 01:07:19.922 align:middle line:90%
can get at higher temperatures.

01:07:19.922 --> 01:07:22.710 align:middle line:84%
So this really annoyed people
and was quite confusing

01:07:22.710 --> 01:07:26.410 align:middle line:84%
and it needs to be explained
by the implant damage

01:07:26.410 --> 01:07:28.770 align:middle line:84%
and its effect on how
the boron diffuses.

01:07:28.770 --> 01:07:31.110 align:middle line:84%
And in fact, TED
today is pretty much

01:07:31.110 --> 01:07:33.565 align:middle line:84%
the dominant effect that
determines junction depths

01:07:33.565 --> 01:07:34.440 align:middle line:90%
and shallow profiles.

01:07:34.440 --> 01:07:37.727 align:middle line:84%
It's not so much ordinary
diffusion or concentration

01:07:37.727 --> 01:07:38.560 align:middle line:90%
dependent diffusion.

01:07:38.560 --> 01:07:41.070 align:middle line:84%
Well, for arsenic, maybe,
but for boron, everything is.

01:07:41.070 --> 01:07:44.580 align:middle line:84%
You cannot possibly model a
shallow junction unless you

01:07:44.580 --> 01:07:47.130 align:middle line:90%
know how to model TED.

01:07:47.130 --> 01:07:50.000 align:middle line:84%
And if I just go on to the
next slide, just to show you,

01:07:50.000 --> 01:07:53.580 align:middle line:84%
if I had given you that problem
and told you nothing about TED,

01:07:53.580 --> 01:07:55.980 align:middle line:84%
and you would have
looked up in your book,

01:07:55.980 --> 01:07:59.020 align:middle line:90%
say, at 800 degrees--

01:07:59.020 --> 01:08:00.580 align:middle line:84%
which is somewhere
right around here,

01:08:00.580 --> 01:08:02.430 align:middle line:84%
here's the boron
diffusion coefficient,

01:08:02.430 --> 01:08:03.420 align:middle line:90%
right at this point--

01:08:03.420 --> 01:08:05.760 align:middle line:84%
and that at 1,000
degrees it's up here

01:08:05.760 --> 01:08:07.230 align:middle line:84%
and the difference
between the two

01:08:07.230 --> 01:08:09.840 align:middle line:84%
is more than two
orders of magnitude.

01:08:09.840 --> 01:08:12.820 align:middle line:84%
So it's almost a
factor of 1,000.

01:08:12.820 --> 01:08:15.820 align:middle line:84%
So clearly, if you're
diffusing at 800,

01:08:15.820 --> 01:08:18.939 align:middle line:84%
it should be a lot
less, a lot shallower

01:08:18.939 --> 01:08:23.335 align:middle line:84%
junction, even if you're doing
it for two minutes versus ten

01:08:23.335 --> 01:08:24.010 align:middle line:90%
seconds.

01:08:24.010 --> 01:08:26.870 align:middle line:84%
Two minutes is 120
seconds, so 10 into that.

01:08:26.870 --> 01:08:28.250 align:middle line:90%
So I'm doing it 12 times longer.

01:08:28.250 --> 01:08:28.750 align:middle line:90%
Fine.

01:08:28.750 --> 01:08:31.830 align:middle line:84%
But the diffusion
coefficient is 1,000 times,

01:08:31.830 --> 01:08:34.995 align:middle line:84%
should be 1,000 times
slower at 800, but it's not.

01:08:34.995 --> 01:08:36.370 align:middle line:84%
In fact, it's
1,000 times faster.

01:08:36.370 --> 01:08:37.460 align:middle line:90%
It's a lot faster.

01:08:37.460 --> 01:08:40.450 align:middle line:84%
And that whole effect is called
trans enhanced diffusion.

01:08:40.450 --> 01:08:43.420 align:middle line:84%
It results from all the
interstitials that were

01:08:43.420 --> 01:08:46.569 align:middle line:84%
implanted, that plus-one
interstitials giving rise

01:08:46.569 --> 01:08:48.220 align:middle line:90%
to [? 311 ?]s and all that.

01:08:48.220 --> 01:08:49.720 align:middle line:84%
And so the next
lecture, we're going

01:08:49.720 --> 01:08:53.770 align:middle line:84%
to spend trying to understand
these profiles and their time

01:08:53.770 --> 01:08:54.490 align:middle line:90%
dependence.

01:08:54.490 --> 01:08:56.899 align:middle line:90%


01:08:56.899 --> 01:08:59.270 align:middle line:90%
So let me summarize on slide 28.

01:08:59.270 --> 01:09:01.800 align:middle line:84%
Basically, so far,
in this lecture,

01:09:01.800 --> 01:09:06.020 align:middle line:84%
we said that we can separate
the energy loss processes

01:09:06.020 --> 01:09:08.090 align:middle line:84%
completely independent
of each other.

01:09:08.090 --> 01:09:10.189 align:middle line:84%
To first order, we
have nuclear processes,

01:09:10.189 --> 01:09:12.319 align:middle line:84%
which are these billiard
ball collisions,

01:09:12.319 --> 01:09:14.840 align:middle line:84%
and we have
electronic drag force.

01:09:14.840 --> 01:09:16.620 align:middle line:84%
The nuclear stopping
dominates when

01:09:16.620 --> 01:09:20.300 align:middle line:84%
you have a heavy ion
over most of its path.

01:09:20.300 --> 01:09:22.130 align:middle line:84%
For a light ion,
nuclear stopping

01:09:22.130 --> 01:09:27.680 align:middle line:84%
dominates only at the end of
range, at very low energies.

01:09:27.680 --> 01:09:31.010 align:middle line:84%
It's the nuclear stopping
that damages the crystal

01:09:31.010 --> 01:09:33.149 align:middle line:84%
by the creation
of silicon recoil.

01:09:33.149 --> 01:09:35.930 align:middle line:84%
So it knocks silicons off of
their lattice sites and they

01:09:35.930 --> 01:09:38.450 align:middle line:90%
knock other atoms off.

01:09:38.450 --> 01:09:40.939 align:middle line:84%
And that creates what's
called a collision cascade.

01:09:40.939 --> 01:09:45.170 align:middle line:84%
The damage profile
peaks right near rp.

01:09:45.170 --> 01:09:48.470 align:middle line:84%
If you want to calculate that,
you can just, maybe 80% of rp

01:09:48.470 --> 01:09:51.350 align:middle line:84%
gives you a rough idea
of the depth of damage.

01:09:51.350 --> 01:09:53.840 align:middle line:84%
For heavy ions, the
damage is more stable.

01:09:53.840 --> 01:09:56.030 align:middle line:84%
That is, it doesn't tend
to anneal out in the ion

01:09:56.030 --> 01:09:58.560 align:middle line:90%
implanter at room temperature.

01:09:58.560 --> 01:10:00.810 align:middle line:84%
And there's a tendency
for a heavy ion

01:10:00.810 --> 01:10:03.240 align:middle line:84%
to form an amorphous
layer from the surface

01:10:03.240 --> 01:10:04.680 align:middle line:90%
all the way down to some depth.

01:10:04.680 --> 01:10:07.470 align:middle line:84%
That amorphous layer can be
regrown relatively easily

01:10:07.470 --> 01:10:08.310 align:middle line:90%
in silicon.

01:10:08.310 --> 01:10:10.920 align:middle line:84%
Not true in other
semiconductors, however.

01:10:10.920 --> 01:10:15.460 align:middle line:84%
It results in relatively
efficient dopant activation.

01:10:15.460 --> 01:10:17.680 align:middle line:84%
For light ions like
boron and phosphorus,

01:10:17.680 --> 01:10:19.930 align:middle line:84%
below a certain dose, it
is difficult to produce

01:10:19.930 --> 01:10:21.970 align:middle line:84%
an amorphous layer
at room temperature.

01:10:21.970 --> 01:10:24.070 align:middle line:84%
And as a result, the
activation of the dopants

01:10:24.070 --> 01:10:25.000 align:middle line:90%
is a lot more complex.

01:10:25.000 --> 01:10:27.760 align:middle line:84%
It's very dose dependent,
and it can be temperature

01:10:27.760 --> 01:10:30.710 align:middle line:90%
dependent in an odd fashion.

01:10:30.710 --> 01:10:33.770 align:middle line:84%
There is this plus-one
model for residual damage

01:10:33.770 --> 01:10:35.300 align:middle line:84%
that says that
there's roughly one

01:10:35.300 --> 01:10:37.790 align:middle line:84%
excess interstitial
for every primary ion

01:10:37.790 --> 01:10:38.960 align:middle line:90%
that I ion implanted.

01:10:38.960 --> 01:10:42.860 align:middle line:84%
So it's relatively easy
order of magnitude estimate.

01:10:42.860 --> 01:10:44.635 align:middle line:84%
And this is after
the initial vacancy

01:10:44.635 --> 01:10:46.010 align:middle line:84%
and interstitial
recombination is

01:10:46.010 --> 01:10:49.670 align:middle line:84%
taking place, which only takes
a few fractions of a second.

01:10:49.670 --> 01:10:51.770 align:middle line:84%
These excess interstitials,
however, they

01:10:51.770 --> 01:10:54.020 align:middle line:84%
cluster into little
[? 311 ?] defects.

01:10:54.020 --> 01:10:57.170 align:middle line:84%
Those defects dissolve
at a relatively slow rate

01:10:57.170 --> 01:10:59.360 align:middle line:84%
on the order of ten
seconds to minutes,

01:10:59.360 --> 01:11:01.850 align:middle line:84%
and it's those
little, that [? 311 ?]

01:11:01.850 --> 01:11:05.300 align:middle line:84%
evaporation or dissolution,
that gives rise

01:11:05.300 --> 01:11:07.370 align:middle line:90%
to the time dependence of TED.

01:11:07.370 --> 01:11:11.100 align:middle line:84%
So by understanding [? 311 ?]
defects to a certain extent,

01:11:11.100 --> 01:11:14.120 align:middle line:84%
we can understand the time
dependence of TED and, in fact,

01:11:14.120 --> 01:11:15.660 align:middle line:84%
by understanding
[? 311 ?] defects,

01:11:15.660 --> 01:11:17.410 align:middle line:84%
we'll be able to come
up with a model that

01:11:17.410 --> 01:11:22.080 align:middle line:84%
could predict this kind of
strange looking behavior.

01:11:22.080 --> 01:11:22.580 align:middle line:90%
OK.

01:11:22.580 --> 01:11:26.120 align:middle line:84%
So that's what I wanted
to go through today.

01:11:26.120 --> 01:11:27.230 align:middle line:90%
There were three handouts.

01:11:27.230 --> 01:11:28.313 align:middle line:90%
Make sure you've got them.

01:11:28.313 --> 01:11:30.480 align:middle line:84%
Today's lecture notes,
homework number four

01:11:30.480 --> 01:11:32.552 align:middle line:84%
which is due on November
2, and the solutions

01:11:32.552 --> 01:11:33.510 align:middle line:90%
to homework number two.

01:11:33.510 --> 01:11:35.468 align:middle line:84%
The solutions have been
on the web for a while.

01:11:35.468 --> 01:11:38.370 align:middle line:84%
I just forgot to hand
out the paper copy.

01:11:38.370 --> 01:11:39.060 align:middle line:90%
OK.

01:11:39.060 --> 01:11:41.610 align:middle line:90%
So we'll see you next Tuesday.

01:11:41.610 --> 01:11:44.630 align:middle line:84%
Hopefully we get to
watch the World Series.

01:11:44.630 --> 01:11:49.000 align:middle line:90%