SES # | TOPICS | ASSIGNMENTS |
---|---|---|
1 | Introduction — processes and variation framework | |
2 | Semiconductor process variation | Assignment 1 out |
3 | Mechanical process variation — physical causes and interpreting data | |
4 | Probability models of manufacturing processes | Assignment 1 due, assignment 2 out |
5 | Probability models, parameter estimation, and sampling | |
6 | Sampling distributions and statistical hypotheses | Assignment 2 due, assignment 3 out |
7 | Shewhart SPC and process capability | |
8 | Process capability and alternative SPC methods | Assignment 3 due, assignment 4 out |
9 | Advanced and multivariate SPC | |
10 | Yield modeling | Assignment 4 due, assignment 5 out |
Quiz 1 (covers through Ses #9) |
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11 | Introduction to analysis of variance | |
12 | Full factorial models | Assignment 5 due, assignment 6 out |
13 | Modeling testing and fractional factorial models | |
14 | Aliasing and higher order models | Assignment 6 due, assignment 7 out |
15 | Response surface modeling and process optimization | |
16 | Process robustness | Assignment 7 due, assignment 8 out |
17 | Nested variance components | |
18 | Sequential experimentation: “Experimentation and Robust Design and Engineering Systems.” | Assignment 8 due |
Quiz 2 |
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19 | Case study 1: tungsten CVD DOE/RSM | Project proposal due |
20 | Case study 2: cycle to cycle control | |
21 | Case study 3: spatial modeling | Project meeting due |
22 | Case study 4: “Modeling the Embossing/Imprinting of Thermoplastic Layers.” | |
23 | Project presentations 1 | |
24 | Project presentations 2 |
Calendar
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As Taught In
Spring
2008
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Demonstration Videos
assignment_turned_in
Problem Sets with Solutions
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