2.830J | Spring 2008 | Graduate

Control of Manufacturing Processes (SMA 6303)

Calendar

SES # TOPICS ASSIGNMENTS
1 Introduction — processes and variation framework  
2 Semiconductor process variation Assignment 1 out
3 Mechanical process variation — physical causes and interpreting data  
4 Probability models of manufacturing processes Assignment 1 due, assignment 2 out
5 Probability models, parameter estimation, and sampling  
6 Sampling distributions and statistical hypotheses Assignment 2 due, assignment 3 out
7 Shewhart SPC and process capability  
8 Process capability and alternative SPC methods Assignment 3 due, assignment 4 out
9 Advanced and multivariate SPC  
10 Yield modeling Assignment 4 due, assignment 5 out

Quiz 1 (covers through Ses #9)

11 Introduction to analysis of variance  
12 Full factorial models Assignment 5 due, assignment 6 out
13 Modeling testing and fractional factorial models  
14 Aliasing and higher order models Assignment 6 due, assignment 7 out
15 Response surface modeling and process optimization  
16 Process robustness Assignment 7 due, assignment 8 out
17 Nested variance components  
18 Sequential experimentation: “Experimentation and Robust Design and Engineering Systems.” Assignment 8 due

Quiz 2

19 Case study 1: tungsten CVD DOE/RSM Project proposal due
20 Case study 2: cycle to cycle control  
21 Case study 3: spatial modeling Project meeting due
22 Case study 4: “Modeling the Embossing/Imprinting of Thermoplastic Layers.”  
23 Project presentations 1  
24 Project presentations 2  
Learning Resource Types
Demonstration Videos
Problem Sets with Solutions
Exams with Solutions
Lecture Notes
Lecture Videos
Written Assignments with Examples