### Course Meeting Times

Lectures: 2 sessions / week, 1.5 hours / session

### Prerequisites

Either or both 2.010, 15.075 or equivalent (either or both statistics or classical controls).

### Required Text

Montgomery, Douglas C. *Introduction to Statistical Quality Control.* 5th ed. New York, NY: Wiley, 2004. ISBN: 9780471656319.

May, Gary S., and Costas J. Spanos. *Fundamentals of Semiconductor Manufacturing and Process Control*. Hoboken, NJ: Wiley-Interscience, 2006. ISBN: 9780471784067.

### Reference Texts

#### For Processes

Kalpakjian, S. *Manufacturing Processes for Engineering Materials.* 3rd ed. Menlo Park, CA: Addison Wesley, 1996. ISBN: 9780201823707.

#### For Statistical Analysis, SPC and Designed Experiments

Devor, R. E., T. Chang, and J. W. Sutherland. *Statistical Quality Design and Control.* New York, NY: Macmillan, 1992. ISBN: 9780023291807.

Hogg, R. V., and J. Ledotter. *Engineering Statistics.* New York, NY: Macmillan, 1987. ISBN: 9780023557903.

Bendat, J. S., and A. G. Piersol. *Random Data.* 2nd ed. New York, NY: Wiley Interscience, 2000. ISBN: 9780471317333.

#### For Feedback Control and Stochastic Control

Ogata, Katsuhiko. *Modern Control Engineering.* 3rd ed. Upper Saddle River, NJ: Prentice Hall, 1996. ISBN: 9780132273077.

Friedland, B. *Control System Design.* New York, NY: McGraw Hill, 1985. ISBN: 9780070224414.

### Grading

ACTIVITIES | PERCENTAGES |
---|---|

Problem sets | 50% |

Quizzes | 40% |

Class participation | 10% |

### Assignments

All except Optimization Project are to be individual efforts.