Course Meeting Times

Lectures: 2 sessions / week, 1.5 hours / session


Either or both 2.010, 15.075 or equivalent (either or both statistics or classical controls).

Required Text

Buy at Amazon Montgomery, Douglas C. Introduction to Statistical Quality Control. 5th ed. New York, NY: Wiley, 2004. ISBN: 9780471656319.

Buy at Amazon May, Gary S., and Costas J. Spanos. Fundamentals of Semiconductor Manufacturing and Process Control. Hoboken, NJ: Wiley-Interscience, 2006. ISBN: 9780471784067.

Reference Texts

For Processes

Buy at Amazon Kalpakjian, S. Manufacturing Processes for Engineering Materials. 3rd ed. Menlo Park, CA: Addison Wesley, 1996. ISBN: 9780201823707.

For Statistical Analysis, SPC and Designed Experiments

Buy at Amazon Devor, R. E., T. Chang, and J. W. Sutherland. Statistical Quality Design and Control. New York, NY: Macmillan, 1992. ISBN: 9780023291807.

Buy at Amazon Hogg, R. V., and J. Ledotter. Engineering Statistics. New York, NY: Macmillan, 1987. ISBN: 9780023557903.

Buy at Amazon Bendat, J. S., and A. G. Piersol. Random Data. 2nd ed. New York, NY: Wiley Interscience, 2000. ISBN: 9780471317333.

For Feedback Control and Stochastic Control

Buy at Amazon Ogata, Katsuhiko. Modern Control Engineering. 3rd ed. Upper Saddle River, NJ: Prentice Hall, 1996. ISBN: 9780132273077.

Buy at Amazon Friedland, B. Control System Design. New York, NY: McGraw Hill, 1985. ISBN: 9780070224414.


Problem sets 50%
Quizzes 40%
Class participation 10%



All except Optimization Project are to be individual efforts.