The lecture notes for this course are closely based on the course textbook:
Rabaey, Jan, Anantha Chandrakasan, and Bora Nikolic. Digital Integrated Circuits: A Design Perspective. 2nd ed. Upper Saddle River, NJ: Prentice Hall, 2002. ISBN: 0130909963.
Use the chapter numbers below to find the slides corresponding to the lecture topics, available on the textbook web site.
LEC # | TOPICS | CHAPTER # |
---|---|---|
1 |
Challenges in Digital IC Design
Course Overview |
1 |
2 |
_CMOS Inverter I
_MOS Device Model with Sub-micron Effects |
3, 5 |
3 |
CMOS Inverter II
CMOS Propagation Delay |
5 |
Tutorial on Design Tools - Layout of a CMOS Gate, Extraction, SPICE, IRSIM | ||
4 |
CMOS Inverter III
Components of Energy and Power |
5 |
5 |
Combinational Logic I
Static CMOS Construction |
6 |
6 |
Combinational Logic II
Pass Transistor / Transmission Gate Logic |
6 |
7 |
Combinational Logic III
Dynamic Logic Design Considerations |
6 |
8 |
Combinational Logic IV
Power Consumption in CMOS Logic (cont.) |
6 |
9 |
Arithmetic Structures / Bit Slice Design
Adders, Multipliers, Shifters Project Schedule and Guidelines |
8, 11 |
10 |
Evening Session on Exploring Project Ideas
Finish Arithmetic Structures and Project Ideas |
|
11 |
Guest Lecture by Prof. Tayo Akinwande
Integrated CMOS Processing |
2 |
12 |
Sequential Circuits I
Classification / Parameters |
7 |
13 |
Sequential Circuits II
Race Condition |
7 |
Quiz #1
Covers Inverter, Combinational Logic |
||
14 |
Sequential Circuits: III
Pulse Based Registers |
7, 10 |
15 |
Interconnect
Capacitance Estimation |
4, 9 |
16 |
Interconnect (cont.)
Issues in Timing - Impact of Clock Skew and Jitter |
9, 10 |
17 |
Clock Distribution
Origins of Clock Skew / Jitter and Impact on Performance |
10 |
18 |
Memory I: ROM / EPROM / PLA Design
Organization / Architecture |
12 |
19 |
Memory II: SRAM Design
Cell Design |
|
20 |
Memory III
DRAM Design |
|
Quiz #2
Covers Arithmetic Structures, Inter-connect, Sequential Circuits and Memory |
||
21 |
Advanced Voltage Scaling Techniques
DC-DC Converter Design |
11 |
22 |
Power Reduction Through Switching Activity Reduction
Testing in VLSI Defects, Fault Models, Path Sensitization |
|
Presentation of Final Projects | ||
Presentation of Final Projects (cont.) |