Calendar

LEC #	TOPICS	KEY DATES
1	Overview of Semiconductor Manufacturing
Statistical Process Control
2	Statistics Review: Distributions
3	Statistics Review: Estimation	PS #1 Due
4	Hypothesis Tests and Control Chart Introduction
5	Control Charts
6	Advanced Control Charts, Nested Variance	PS #2 Due
Experimental Design
7	Analysis and Design of Experiments
8	ANOVA, Variance Component Estimation	PS #3 Due
9	MANOVA, Factorial Experiments Quiz #1
Yield and Yield Learning
10	Design of Experiments and Response Surface Modeling
11	RSM and Regression	PS #4 Due
12	Yield Management and Modeling
13	Yield Modeling	PS #5 Due
Advanced Process Control
14	Spatial Modeling
15	Sensors and Signals	PS #6 Due
16	PCA and Time Series
17	Run by Run Control	Critical Paper Review Due
18	Real Time Control, Scheduling
Factory Operation and Design
19	Scheduling Quiz #2	PS #7 Due
20	Planning
21	Factory Design and Efficiency