Control of Manufacturing Processes (SMA 6303)
1: Introduction — Processes and Variation Framework
2: Semiconductor Process Variation
3: Mechanical Process Variation
4: Probability Models of Manufacturing Processes
5: Probability Models, Parameter Estimation, and Sampling
6: Sampling Distributions and Statistical Hypotheses
7: Shewhart SPC and Process Capability
8: Process Capability and Alternative SPC Methods
9: Advanced and Multivariate SPC
10: Yield Modeling
11: Introduction to Analysis of Variance
12: Full Factorial Models
13: Modeling Testing and Fractional Factorial Models
14: Aliasing and Higher Order Models
15: Response Surface Modeling and Process Optimization
16: Process Robustness
17: Nested Variance Components
18: Sequential Experimentation
19: Case Study 1: Tungsten CVD DOE/RSM
20: Case Study 2: Cycle to Cycle Control
21: Case Study 3: Spatial Modeling
22: Case Study 4: "Modeling the Embossing/Imprinting of Thermoplastic Layers."
Don't show me this again
This is one of over 2,400 courses on OCW. Explore materials for this course in the pages linked along the left.
MIT OpenCourseWare is a free & open publication of material from thousands of MIT courses, covering the entire MIT curriculum.
No enrollment or registration. Freely browse and use OCW materials at your own pace. There's no signup, and no start or end dates.
Knowledge is your reward. Use OCW to guide your own life-long learning, or to teach others. We don't offer credit or certification for using OCW.
Made for sharing. Download files for later. Send to friends and colleagues. Modify, remix, and reuse (just remember to cite OCW as the source.)
Learn more at Get Started with MIT OpenCourseWare